Resonant cavities for measuring the surface resistance of metals at X-band frequencies

Hernández, A.; Martin, E.; Margineda, J.; Zamarro, J.M.

doi:10.1088/0022-3735/19/3/013

Cited by 20 publications

(13 citation statements)

References 10 publications

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“…The first one is very accurate albeit narrow band and often quite expensive due to the customized set of samples in terms of size, shape, etc. [13]. The second one is a broadband characterization technique that uses coaxial cables or waveguides or free-space, with a frequency band depending on the device used and on the instrumentation.…”

Section: Introductionmentioning

confidence: 99%

Novel measurement technique for the electromagnetic characterization of coating materials in the sub-THz frequency range

Passarelli

Bartosik

Rumolo

et al. 2018

Phys. Rev. Accel. Beams

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This paper describes a reliable, handy, and inexpensive measurement system to characterize, in the sub-THz frequency range, the coating materials used in the beam pipes of accelerators. The method is based on time domain measurements of an electromagnetic wave passing through a waveguide having a thin central slab, where the coating material is deposited on both sides. Two horn antennas are integrated on both sides of the device to optimize the signal collection and detection. This novel technique is tested on slabs coated with a nonevaporable getter (NEG) and allows to evaluate the surface impedance in the frequency range from 0.1 to 0.3 THz.

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Section: Introductionmentioning

confidence: 99%

Novel measurement technique for the electromagnetic characterization of coating materials in the sub-THz frequency range

Passarelli

Bartosik

Rumolo

et al. 2018

Phys. Rev. Accel. Beams

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“…The resonator is then placed inside a small cavity made of oxygen free high-conductivity copper (OFHC) which is gold (purity [99.9 %) plated to minimize the radiation loss. The details of this device are well described in some references [15][16][17][18][19][20] [10][11][12][13][14]. The ceramic was sintered by traditional powder processing method [1][2][3].…”

Section: Theoretical Principle and Experiments Methodsmentioning

confidence: 99%

“…Superconducting parallel plate resonator (PPR), a parallel plate capacitor structure with two superconducting films back to back and a dielectric spacer between them was first introduced by Taber [15] to measure the RF surface resistance of superconductor films. This method was then extensively utilized in research studies [16][17][18][19][20][21][22]. In this manuscript, we, in another point of view, will demonstrate that this device can also be used to measure microwave loss tangent of any dielectric materials at cryogenic temperature range with great advantages over the commonly used TE 01d metal cavity method [1,2].…”

Section: Introductionmentioning

confidence: 96%

Measurement of dielectric loss tangent at cryogenic temperature using superconducting film resonator

Zhang

Wang

2015

J Theor Appl Phys

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We demonstrate that the superconducting film resonator can be used to accurately and quantitatively measure the microwave dielectric loss tangent of a variety of materials. Compared to traditional dielectric resonator loaded metal cavity method, it has advantage of small sample size (*2-3 orders of magnitude smaller than the old method), and much higher sensitivity to measure small loss tangent values as small as 10 -5 at around 7 GHz band at cryogenic temperatures. This method can be utilized widely in study of mechanism of microwave loss at cryogenic temperature range, which is extremely important in superconducting microwave application areas, such as novel super quantum computers.

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“…The measurement of the surface impedance at microwave frequencies can be accurately carried out through ad hoc resonant cavities [76,77], which may be expensive and narrowband. A wideband estimation of the surface impedance can be performed with transmission/reflection measurements in free space or in a guided device [78][79][80][81][82][83].…”

Section: Measuring the Surface Impedance Of Thin Sheetsmentioning

confidence: 99%

Electromagnetic Characterisation of Materials by Using Transmission/Reflection (T/R) Devices

et al. 2017

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An overview of transmission/reflection-based methods for the electromagnetic characterisation of materials is presented. The paper initially describes the most popular approaches for the characterisation of bulk materials in terms of dielectric permittivity and magnetic permeability. Subsequently, the limitations and the methods aimed at removing the ambiguities deriving from the application of the classical Nicolson-Ross-Weir direct inversion are discussed. The second part of the paper is focused on the characterisation of partially conductive thin sheets in terms of surface impedance via waveguide setups. All the presented measurement techniques are applicable to conventional transmission reflection devices such as coaxial cables or waveguides.

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Resonant cavities for measuring the surface resistance of metals at X-band frequencies

Cited by 20 publications

References 10 publications

Novel measurement technique for the electromagnetic characterization of coating materials in the sub-THz frequency range

Novel measurement technique for the electromagnetic characterization of coating materials in the sub-THz frequency range

Measurement of dielectric loss tangent at cryogenic temperature using superconducting film resonator

Electromagnetic Characterisation of Materials by Using Transmission/Reflection (T/R) Devices

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