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1947
DOI: 10.1063/1.1697816
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Resonant Cavities for Dielectric Measurements

Abstract: The variable length cavity described in this paper was the subject of a t.hesis submitted to the Graduate School of the University of Pittsburgh, in partial fulfillment of the requirements of the M. S. degree.

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Cited by 35 publications
(8 citation statements)
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“…For thin substrates, relative sample-thickness uncertainty dominates. In Table 3, the estimated accuracy for optimum-size samples agrees with estimates for similar instruments [20,24] …”
Section: Uncertainty Analysissupporting
confidence: 71%
“…For thin substrates, relative sample-thickness uncertainty dominates. In Table 3, the estimated accuracy for optimum-size samples agrees with estimates for similar instruments [20,24] …”
Section: Uncertainty Analysissupporting
confidence: 71%
“…At 450 MHz we determined the dielectric constant and loss tangent by means of a reentrant cavity [Works, 1947], with the sample located in a region of high electric field and negligible magnetic field. Powdered samples were measured in the s•me apparatus by placing the powder in thin-walled cylinders made of low-loss plastic; corrections were applied for the effects of the container.…”
Section: Methods Of Measurementmentioning
confidence: 99%
“…Due to thin sample thickness, the reentrant cavity uncertainty for sample 1 was about 3% [6], while for sample 2, which was four times as thick, the re-entrant cavity imcertainty was about 1% [24].…”
Section: Presentation Of Computed Resultsmentioning
confidence: 99%