2023
DOI: 10.1038/s41467-023-35872-y
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Resolving the intrinsic short-range ordering of K+ ions on cleaved muscovite mica

Abstract: Muscovite mica, KAl2(Si3Al)O10(OH)2, is a common layered phyllosilicate with perfect cleavage planes. The atomically flat surfaces obtained through cleaving lend themselves to scanning probe techniques with atomic resolution and are ideal to model minerals and clays. Despite the importance of the cleaved mica surfaces, several questions remain unresolved. It is established that K+ ions decorate the cleaved surface, but their intrinsic ordering – unaffected by the interaction with the environment – is not known… Show more

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Cited by 21 publications
(29 citation statements)
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“…Similarly, AFM images show that the Li + population in the inner double layer depends on the bulk concentration, showing higher Li + adsorption at higher concentration. However, no charge compensation, as seen for freshly cleaved mica in vacuum, 61 is visible even at 200 mM bulk concentration.…”
Section: Resultsmentioning
confidence: 82%
“…Similarly, AFM images show that the Li + population in the inner double layer depends on the bulk concentration, showing higher Li + adsorption at higher concentration. However, no charge compensation, as seen for freshly cleaved mica in vacuum, 61 is visible even at 200 mM bulk concentration.…”
Section: Resultsmentioning
confidence: 82%
“…Stattdessen reagierte unser System empfindlich auf die Kräfte im Nahbereich, die den atomaren Kontrast erzeugen. Die so erhaltenen Bilder zeigen die Verstimmung der Resonanzfrequenz beim Abrastern in konstanter Höhe über der Oberfläche (Abbildung 2) [4]. Es stellte sich heraus, dass die Kaliumionen an der Oberfläche von Glimmer eine Nahordnung aufweisen.…”
Section: Abbunclassified
“… AFM‐Bild im UHV Rasterkraftmikroskopiebild von im Ultrahochvakuum gespaltenem Glimmer, aufgezeichnet mit dem qPlus‐Sensor bei einer Probentemperatur von 4,7 K (Bild: adaptiert aus [4]). …”
Section: Abbunclassified
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“…117 Moreover, noncontact AFM can be employed to probe the distribution of K + atoms on cleaved mica. 118 Novel methodologies, based in 3D maps have been developed to perform nanomechanical characterization of materials. The basic principle of such methodology involves acquiring several force curves at every single pixel of the image.…”
Section: B Mechanical Propertiesmentioning
confidence: 99%