Resolving power of pixel detector Timepix for wide-range electron, proton and ion detection

Granja, Carlos; Jakůbek, J.; Polansky, Stepan; Zach, V.; Krist, Pavel; Chvátil, David; Štursa, Jan; Sommer, Marek; Ploc, Ondřej; Kodaira, Satoshi; Martišíková, M.

doi:10.1016/j.nima.2018.08.014

Cited by 49 publications

(97 citation statements)

References 75 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Another approach to measure the MCS angles would be the use of the AdvaPIX-TPX3 semiconductor sensor from the work of Granja et al and Charyyev et al [46,47]. The AdvaPIX-TPX3 measures directly the angles of the scattered protons, whereby the conversion of the spot profiles into an angular distribution by equation 8 is unnecessary.…”

Section: Discussionmentioning

confidence: 99%

Experiments and Monte Carlo simulations on multiple Coulomb scattering of protons

et al. 2021

View full text Add to dashboard Cite

Background and purpose: Monte Carlo simulations as well as analytical computations of proton transport in material media require accurate values of multiple Coulomb scattering (MCS) angles. High-quality experimental data on MCS angles in the energy range for proton therapy are, however, sparse. In this work MCS modeling in proton transport was evaluated employing an experimental method to measure these angles on a medical proton beamline in clinically relevant materials. Results are compared to Monte Carlo simulations and analytical models.Materials and methods: Aluminum, brass and lucite (PMMA) scatterers of clinically relevant thicknesses were irradiated with protons at 100, 160 and 220 MeV. Resulting spatial distributions of individual pencil beams were measured with a scintillating screen. The MCS angles were determined by deconvolution and a virtual point source approach. Results were compared to those obtained with the Monte Carlo codes PENH, TOPAS and RayStation Monte Carlo, as well as the analytical models RayStation Pencil Beam Algorithm and the Molière/Fano/Hanson variant of the Molière theory.Results: Experimental data obtained with the presented methodology agree with previously published results within 6%, with an average deviation of 3%. The combined average uncertainty of the experimental data yielded 1.8%, while the combined maximum uncertainty was below 4%. The obtained Monte Carlo results for PENH, TOPAS and RayStation deviate on average for all considered energies, materials and thicknesses, by 2.5%, 3.4% and 2.8% from the experimental data, respectively. For the analytical models the average deviations amount to 4.5% and 2.9% for the RayStation Pencil Beam Algorithm and the Molière/Fano/Hanson model, respectively.Conclusion: The experimental method developed for the present work allowed to measure MCS angles in clinical proton facilities with good accuracy. The presented method permits to extend the database on experimental MCS angles which is rather limited. This work further provides benchmark data for lucite in thicknesses relevant for clinical applications. The data may serve to validate dose engines of treatment planning systems and secondary dose check software. The Monte Carlo and analytical algorithms studied are capable of reproducing MCS data within the required accuracy for clinical applications.

show abstract

Section: Discussionmentioning

confidence: 99%

Experiments and Monte Carlo simulations on multiple Coulomb scattering of protons

et al. 2021

View full text Add to dashboard Cite

show abstract

“…This article introduces the 4D-STEM/PNBD method, that yields powder electron diffraction patterns by means of an arbitrary SEM microscope equipped with a pixelated STEM detector. We used a focused ion beam scanning electron microscope Helios G4 (FIB-SEM microscope; Thermo Fisher Scientific, Waltham, MA, USA) equipped with pixelated STEM detector T-pix (Thermo Fisher Scientific, Waltham, MA, USA), which was based on Timepix technology [ 28 ]. Additional equipment of the microscope comprised an annular STEM3+ detector, which was used for high-resolution bright field images.…”

Section: Methodsmentioning

confidence: 99%

Powder Nano-Beam Diffraction in Scanning Electron Microscope: Fast and Simple Method for Analysis of Nanoparticle Crystal Structure

et al. 2021

View full text Add to dashboard Cite

We introduce a novel scanning electron microscopy (SEM) method which yields powder electron diffraction patterns. The only requirement is that the SEM microscope must be equipped with a pixelated detector of transmitted electrons. The pixelated detectors for SEM have been commercialized recently. They can be used routinely to collect a high number of electron diffraction patterns from individual nanocrystals and/or locations (this is called four-dimensional scanning transmission electron microscopy (4D-STEM), as we obtain two-dimensional (2D) information for each pixel of the 2D scanning array). Nevertheless, the individual 4D-STEM diffractograms are difficult to analyze due to the random orientation of nanocrystalline material. In our method, all individual diffractograms (showing randomly oriented diffraction spots from a few nanocrystals) are combined into one composite diffraction pattern (showing diffraction rings typical of polycrystalline/powder materials). The final powder diffraction pattern can be analyzed by means of standard programs for TEM/SAED (Selected-Area Electron Diffraction). We called our new method 4D-STEM/PNBD (Powder NanoBeam Diffraction) and applied it to three different systems: Au nano-islands (well diffracting nanocrystals with size ~20 nm), small TbF3 nanocrystals (size < 5 nm), and large NaYF4 nanocrystals (size > 100 nm). In all three cases, the STEM/PNBD results were comparable to those obtained from TEM/SAED. Therefore, the 4D-STEM/PNBD method enables fast and simple analysis of nanocrystalline materials, which opens quite new possibilities in the field of SEM.

show abstract

“…The temperature effect on energy deposition measurement is negligible [41]. For more details on the TIMEPIX detector technology, refer to [40,42,43] and references.…”

Section: Minipix Timepix Detector and Data Acquisition Softwarementioning

confidence: 99%

“…The morphology of each cluster is characterized by the following: the position of the cluster center of mass, the total energy deposited, the cluster length, and the angle at which the particle enters the detector. The cluster analysis enables identification of impinging particle type [43]. The analysis of multiple clusters enables particle-byparticle experimental characterization of the mixed radiation fields consisting of primary and secondary protons, secondary electrons, photons, etc.…”

Section: Minipix Timepix Detector and Data Acquisition Softwarementioning

confidence: 99%

A Simple Approach for Experimental Characterization and Validation of Proton Pencil Beam Profiles

et al. 2020

Self Cite

View full text Add to dashboard Cite

Resolving power of pixel detector Timepix for wide-range electron, proton and ion detection

Cited by 49 publications

References 75 publications

Experiments and Monte Carlo simulations on multiple Coulomb scattering of protons

Experiments and Monte Carlo simulations on multiple Coulomb scattering of protons

Powder Nano-Beam Diffraction in Scanning Electron Microscope: Fast and Simple Method for Analysis of Nanoparticle Crystal Structure

A Simple Approach for Experimental Characterization and Validation of Proton Pencil Beam Profiles

Contact Info

Product

Resources

About