Resistivity Studies of Single-Crystal and Polycrystal Films of Aluminum

Bassewitz, A. v. v.; Mitchell, E. N.

doi:10.1103/physrev.182.712

Cited by 48 publications

(10 citation statements)

References 13 publications

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“…Both parts of the resistivities are relevant to the grain boundary and surface roughness, which can significantly influence the damping constant in the Drude model. The bulk resistivities ρ b of sample A and sample B are 0.22 and 2.65 μΩ cm, which are taken from references1617. ρ s is shown as14…”

Section: Resultsmentioning

confidence: 99%

Surface roughness effects on aluminium-based ultraviolet plasmonic nanolasers

Chung

Cheng

Chou

et al. 2017

Sci Rep

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We systematically investigate the effects of surface roughness on the characteristics of ultraviolet zinc oxide plasmonic nanolasers fabricated on aluminium films with two different degrees of surface roughness. We demonstrate that the effective dielectric functions of aluminium interfaces with distinct roughness can be analysed from reflectivity measurements. By considering the scattering losses, including Rayleigh scattering, electron scattering, and grain boundary scattering, we adopt the modified Drude-Lorentz model to describe the scattering effect caused by surface roughness and obtain the effective dielectric functions of different Al samples. The sample with higher surface roughness induces more electron scattering and light scattering for SPP modes, leading to a higher threshold gain for the plasmonic nanolaser. By considering the pumping efficiency, our theoretical analysis shows that diminishing the detrimental optical losses caused by the roughness of the metallic interface could effectively lower (~33.1%) the pumping threshold of the plasmonic nanolasers, which is consistent with the experimental results.

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Section: Resultsmentioning

confidence: 99%

Surface roughness effects on aluminium-based ultraviolet plasmonic nanolasers

Chung

Cheng

Chou

et al. 2017

Sci Rep

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“…The major contribution to temperature independent resistivity component in the alloys comes from solutes in the matrix. Contributions of dislocations or subgrain and grain boundaries in Al-Mn and Al-Sc-Zrbased alloys are two orders of magnitude lower [6,[30][31][32][33]. Therefore, a higher RRR value corresponds mainly to higher purity of the matrix, i.e.…”

Section: Methodsmentioning

confidence: 99%

Annealing effects in hot-deformed Al-Mn-Sc-Zr alloys

Vlach¹,

Stulı́ková²,

Smola³

et al. 2021

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Microstructure, thermal, electrical and mechanical properties of the hot-extruded and hotrolled AlMnScZr alloys were studied. The electrical resistometry and microhardness together with differential scanning calorimetry measurements were compared with microstructure development observed by transmission electron microscopy, X-ray diffraction, and electron backscatter diffraction. Fine subgrain or grain structure developed and fine coherent Al3(Sc,Zr) particles precipitated during hot deformation and subsequent cooling. The distinct resistivity changes are mainly caused by precipitation of Mn-containing particles. The pronounced two-stage development of the Al6(Mn,Fe)-phase precipitation was observed. Nevertheless, the precipitation has a negligible effect on microhardness. The presence of the Mn-containing particles with a size of ∼ 50 nm inside subgrains or grains and ∼ 2 µm at subgrain or grain boundaries has a significant antirecrystallization effect. The combination of Mn, Sc and Zr additions to Al suppresses recrystallization during isothermal annealing at 550• C. Hot deformation has no effect on the apparent activation energy values of the Al3Sc-phase precipitation (Q = 109 kJ mol −1 ) and Al6Mn-phase precipitation (Q = 156 kJ mol −1 ).K e y w o r d s: Al3Sc phase, hot extrusion, hot rolling, activation energy, EBSD, DSC

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“…1 ͑inset͒ we have plotted the room-temperature resistivity as a function of Fe thickness. Data could be fitted approximately by the quasiclassical-size effect Fuchs-Sondheimer equation 10 and yielded a mean free path of elastic scattering of about 510 nm. This value of scattering length is surprisingly large as would correspond to extremely clean films, where the only sources of scattering would be surface roughness and dislocations developing during the growth process.…”

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confidence: 99%

Enhanced and oscillatory magnetoresistance of thin Fe(001) films

Martínez-Boubeta

Balcells

Cebollada

2006

Applied Physics Letters

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We have studied the magnetoresistance of single-crystalline (001) Fe films prepared by sputtering techniques and covered by epitaxial MgO or Pt protective layers. The influence of the thickness of the magnetic layer as well as of the nature of the capping layer on the Fe anisotropic magnetoresistance was investigated by four-terminal probe, measurements performed with the current J in the [110] magnetically hard direction. We found an enhancement in the magnetoresistance value with respect to bulk and oscillations in the high field regime in MgO covered Fe∕MgO(001) ultrathin films. A plausible explanation is that the enhanced magnetoresistance is due to electronic confinement effects, not present in similar Pt∕Fe∕MgO(001) samples.

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Resistivity Studies of Single-Crystal and Polycrystal Films of Aluminum

Cited by 48 publications

References 13 publications

Surface roughness effects on aluminium-based ultraviolet plasmonic nanolasers

Surface roughness effects on aluminium-based ultraviolet plasmonic nanolasers

Annealing effects in hot-deformed Al-Mn-Sc-Zr alloys

Enhanced and oscillatory magnetoresistance of thin Fe(001) films

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