2022
DOI: 10.12693/aphyspola.141.439
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Resistive Switching in Polyvinylpyrrolidone/Molybdenum Disulfide Composite-Based Memory Devices

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Cited by 4 publications
(3 citation statements)
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“…After conducting the electroforming scan, we proceeded to perform full cycle voltage scans (0 → +V max → 0 → −V max → 0) in order to analyze the memory behavior of the devices. This methodology has been previously documented [6,12,13].…”
Section: Transport and Memory Studymentioning
confidence: 99%
“…After conducting the electroforming scan, we proceeded to perform full cycle voltage scans (0 → +V max → 0 → −V max → 0) in order to analyze the memory behavior of the devices. This methodology has been previously documented [6,12,13].…”
Section: Transport and Memory Studymentioning
confidence: 99%
“…compared the resistive switching behavior in composite‐based memory devices by using different active layers and top electrode configurations. [ 26 ] Yang et al. choice of ion transfer material was an important factor in the determination of the nucleation side.…”
Section: Introductionmentioning
confidence: 99%
“…Dlamini et al compared the resistive switching behavior in composite-based memory devices by using different active layers and top electrode configurations. [26] Yang et al choice of ion transfer material was an important factor in the determination of the nucleation side. [23,27] The studies have revealed the potential of polyvinylpyrrolidone as an active layer in resistive switching devices for fundamental research.…”
Section: Introductionmentioning
confidence: 99%