2016
DOI: 10.1021/acsami.6b10992
|View full text |Cite
|
Sign up to set email alerts
|

Resistive Switching and Modulation of Pb(Zr0.4Ti0.6)O3/Nb:SrTiO3 Heterostructures

Abstract: In this work, epitaxial Pb(ZrTi)O (PZT) thin films with different thicknesses were deposited on Nb-doped SrTiO (NSTO) single-crystal substrates by chemical solution deposition (CSD), and their ferroelectric resistive switching behaviors were investigated. The results showed that the maximum ON/OFF ratio up to 850 could be obtained in the PZT/NSTO heterostructure with the 150 nm thick PZT film. On the basis of the Schottky-Simmons model and the modified semiconductor theory, we also evaluated the interfacial bu… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
2

Citation Types

0
27
2

Year Published

2019
2019
2022
2022

Publication Types

Select...
5

Relationship

1
4

Authors

Journals

citations
Cited by 42 publications
(29 citation statements)
references
References 44 publications
(88 reference statements)
0
27
2
Order By: Relevance
“…Notably, under the tested conditions of EBD and accelerating voltage, the resistance of BTO varied quasi‐continuously over two orders of magnitude. The variation in BTO resistance driven by e‐beam effect is lower than the ON/OFF ratio of about 10 3 achieved in other memristive devices with similar thickness of the FE material 17,27,42. However, the values of voltage involved in the present I / V curves are about one order of magnitude lower than in those reports.…”
Section: Figurecontrasting
confidence: 70%
See 2 more Smart Citations
“…Notably, under the tested conditions of EBD and accelerating voltage, the resistance of BTO varied quasi‐continuously over two orders of magnitude. The variation in BTO resistance driven by e‐beam effect is lower than the ON/OFF ratio of about 10 3 achieved in other memristive devices with similar thickness of the FE material 17,27,42. However, the values of voltage involved in the present I / V curves are about one order of magnitude lower than in those reports.…”
Section: Figurecontrasting
confidence: 70%
“…The present quest in the field of NC is to implement hardware and materials capable of reproducing the extensive capabilities in terms of learning, adaptability, and low‐power operation of the human brain. In this regard, there has been a growing interest with respect to the opportunities offered by the exceptional functional properties of ferroelectric (FE) oxides 11–18…”
Section: Figurementioning
confidence: 99%
See 1 more Smart Citation
“…d) ON/OFF ratios as a function of the Pb(Zr 0.4 Ti 0.6 )O 3 thickness. All panels reproduced with permission . Copyright 2016, American Chemical Society.…”
Section: Approaches To Improve Rs Propertiesmentioning
confidence: 99%
“…Moreover, the domain walls were found to be less conductive than the domains of each polarization direction, regardless of the thickness, by conduction atomic force microscopy (CAFM). The states of vertical domains are not tested in this work, and the conclusions may [24] Copyright 2016, American Chemical Society. be incomplete.…”
Section: Approaches To Improve Rs Propertiesmentioning
confidence: 99%