2011
DOI: 10.1007/978-1-4614-0225-1_1
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Residual Stresses Measurement and Inner Geometry Inspection of Pipelines by Optical Methods

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Cited by 5 publications
(2 citation statements)
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“…In this respect, the response time of less than 1s can be compatible with real-time operation for a plant with a defect rate < 1defect/s [14]. We remark here that most processing time is devoted to features identification that can be drastically reduced using modern parallel computing architectures, essentially based on CUDA architectures [64,65].…”
Section: Discussionmentioning
confidence: 99%
“…In this respect, the response time of less than 1s can be compatible with real-time operation for a plant with a defect rate < 1defect/s [14]. We remark here that most processing time is devoted to features identification that can be drastically reduced using modern parallel computing architectures, essentially based on CUDA architectures [64,65].…”
Section: Discussionmentioning
confidence: 99%
“…Digital speckle pattern interferometry (DSPI) and electronic speckle pattern interferometry (ESPI) are the two basic approaches of illuminating the surface either through a single illumination beam or double illumination beams [15,22,23]. Typically, single illumination is mainly suitable for measurements of out-of-plane displacements where the interference is constructed by superimposing a reference illumination on the surface illumination, which can be directed to the camera sensor or to an auxiliary surface.…”
Section: Introductionmentioning
confidence: 99%