2017
DOI: 10.1016/j.addma.2017.07.007
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Residual stress measurements on AISI 316L samples manufactured by selective laser melting

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Cited by 151 publications
(102 citation statements)
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“…This fact is also proved by diffractograms for P200 (133 J/mm 3 , Figure 8c) and H70 samples (167 J/mm 3 , Figure 8d): An increase of intensity of β-{110} peak can be observed for some ψ tilts in the case of H70 sample, indicating some texture in the β-phase (discussed in [40]). In [16], no dependence of RS on Ev was observed for fully dense AISI316L samples. This conclusion is only partially contradictory to ours: the authors of [16] have investigated only a small range of Ev (70 J/mm 3 -140 J/mm 3 ).…”
Section: Effect Of Power and Hatch Distance Variationmentioning
confidence: 86%
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“…This fact is also proved by diffractograms for P200 (133 J/mm 3 , Figure 8c) and H70 samples (167 J/mm 3 , Figure 8d): An increase of intensity of β-{110} peak can be observed for some ψ tilts in the case of H70 sample, indicating some texture in the β-phase (discussed in [40]). In [16], no dependence of RS on Ev was observed for fully dense AISI316L samples. This conclusion is only partially contradictory to ours: the authors of [16] have investigated only a small range of Ev (70 J/mm 3 -140 J/mm 3 ).…”
Section: Effect Of Power and Hatch Distance Variationmentioning
confidence: 86%
“…However, experimental data on RS in LPBF materials are still incomplete or even show contradictory trends depending on material and measurement method. For instance, in [16] the change of E v of a fully dense AISI316L steel (density around 99.9%) has shown no impact on RS, measured by laboratory X-ray diffraction. In contrast, in our previous study, highly dense Ti-6Al-4V with different E v has shown significant difference in RS along the building direction, obtained by synchrotron X-ray diffraction (SXRD) [13].…”
Section: Introductionmentioning
confidence: 99%
“…Although XRD is widely used to estimate the residual stresses, there is a debate on the obtained residual stress values and the measurement procedure for SLM-produced samples. Some studies revealed that the residual stresses were frequently shown to approach the material's yield strength [19,22,23], while residual stresses reported for SLM-produced AlSi10Mg (summarized in Table 1) were far lower than its yield strength reported in the literature (200-300 MPa [24][25][26][27]). Moreover, a significant fluctuation was observed in the reported values and the sign of the surface residual stress cannot be determined properly.…”
Section: Introductionmentioning
confidence: 96%
“…Contrastingly, diffraction methods (such as X-ray diffraction (XRD) [10] and neutron diffraction (ND) [11,12]) are non-destructive. They can be used to obtain full-field strain/stress distribution by measuring at multiple positions on the sample surface [13][14][15][16] or can be combined with material removal techniques to acquire the in-depth distribution of residual stresses [17][18][19][20][21]. Nowadays, XRD becomes major non-destructive residual stresses measurement method because of its relative affordability and easy accessibility.…”
Section: Introductionmentioning
confidence: 99%
“…The crystallographic texture has been also shown to be sensitive to the SLM processing parameters and can vary from random using low energy input [14][15][16] to strong texture [14,16] during SLM processing. Extensive studies have been carried out on the optimization of the SLM process parameters for the 316L steel [17,14,[18][19][20][21][22][23][24][25], with respect to porosity minimization, mechanical properties optimization and occurrence of residual stress. However, not as many studies exist for SLM-processing of the 304L steel [26][27][28][29].…”
mentioning
confidence: 99%