Residual Stress Evaluation at Bone Implant Interfaces Using High Energy X-Ray Diffraction

Mireux, Bastien; Buslaps, T.; Honkimäki, V.; Lodini, Alain; Sprauel, Jean‐Michel

doi:10.4028/www.scientific.net/msf.652.180

Cited by 3 publications

(2 citation statements)

References 8 publications

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“…Synchrotron microtomography, often in combination with digital volume correlation, has so far been used to analyse the deformation processes at the interface (Le Cann et al, 2019;Madi et al, 2020). Strains at the bone-implant interface have been investigated using synchrotron diffraction (Mireux et al, 2021). Combined information from a single specimen, Experimental protocol: the type of trigger and threshold need to be specified together with the type of X-ray measurement that will be triggered.…”

Section: Example Of a Biological Specimen Used For Phase Identificationmentioning

confidence: 99%

Beamline K11 DIAD: a new instrument for dual imaging and diffraction at Diamond Light Source

et al. 2021

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The Dual Imaging and Diffraction (DIAD) beamline at Diamond Light Source is a new dual-beam instrument for full-field imaging/tomography and powder diffraction. This instrument provides the user community with the capability to dynamically image 2D and 3D complex structures and perform phase identification and/or strain mapping using micro-diffraction. The aim is to enable in situ and in operando experiments that require spatially correlated results from both techniques, by providing measurements from the same specimen location quasi-simultaneously. Using an unusual optical layout, DIAD has two independent beams originating from one source that operate in the medium energy range (7–38 keV) and are combined at one sample position. Here, either radiography or tomography can be performed using monochromatic or pink beam, with a 1.4 mm × 1.2 mm field of view and a feature resolution of 1.2 µm. Micro-diffraction is possible with a variable beam size between 13 µm × 4 µm and 50 µm × 50 µm. One key functionality of the beamline is image-guided diffraction, a setup in which the micro-diffraction beam can be scanned over the complete area of the imaging field-of-view. This moving beam setup enables the collection of location-specific information about the phase composition and/or strains at any given position within the image/tomography field of view. The dual beam design allows fast switching between imaging and diffraction mode without the need of complicated and time-consuming mode switches. Real-time selection of areas of interest for diffraction measurements as well as the simultaneous collection of both imaging and diffraction data of (irreversible) in situ and in operando experiments are possible.

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Section: Example Of a Biological Specimen Used For Phase Identificationmentioning

confidence: 99%

Beamline K11 DIAD: a new instrument for dual imaging and diffraction at Diamond Light Source

et al. 2021

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“…From the interfaces, the scan was carried out from 0 to 1 mm in 0.1. We took one measurement point very far from the interface (3mm) in order to have a reference [6].…”

Section: Residual Stressesmentioning

confidence: 99%

Evaluation of Residual Stresses at the Interface with Implant by Synchrotron Radiation

Benmarouane¹,

Citterio²,

Millet³

et al. 2013

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The aim of the present study was to study the interface implant-bone by synchrotron radiation, the implant has two faces the first one coated with hydroxyapatite and the second uncoated. In orthopaedic surgery, Titanium (Ti-Al-4V) implants are currently coated with hydroxyapatite (HAp), Ca10 (PO4)6 (OH)2, in order to obtain a stable and functional direct connection between the bone and the implant. At the implant-bone interface, the new bone reconstituted after two months of implantation must have the same properties like the natural bone in order to accept the implant. Therefore we studied the residuals stresses and texture of the new bone crystals reconstituted at the interface using synchrotron radiation on ID15 at ESRF in Grenoble, France.

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Residual Stress Analysis of Stellite-Coated Forging Tool Steel Using Synchrotron Radiation Diffraction

Toumi¹,

Benmarouane

Bonnefoy

et al. 2012

MSF

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Synchrotron X-ray diffraction is reliable to measure residual stresses and characterize existing phases close to substrate/coating interface. In the present study, we focus on the cobalt-alloys coating deposited on stainless steel forging tools via Plasma Transfer Arc (PTA) process. Forging tools always work in high temperature conditions. Since fatigue crack is often detected near to the interface, we used synchrotron radiation to characterize residual stress profiles both in the substrate and coating sides. Also, we defined phases inside diluted substrate layers and in the stellite coating using a Rietveld refinement.

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Residual Stress Evaluation at Bone Implant Interfaces Using High Energy X-Ray Diffraction

Cited by 3 publications

References 8 publications

Beamline K11 DIAD: a new instrument for dual imaging and diffraction at Diamond Light Source

Beamline K11 DIAD: a new instrument for dual imaging and diffraction at Diamond Light Source

Evaluation of Residual Stresses at the Interface with Implant by Synchrotron Radiation

Residual Stress Analysis of Stellite-Coated Forging Tool Steel Using Synchrotron Radiation Diffraction

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