“…Defect-related nonradiative losses in sequentially deposited perovskite films must be reduced to further increase the efficiency. Although the shallow-level defects in perovskite grains are the dominant intrinsic defects, the grain boundaries generally contain several deep-level defects. , Two categories of passivators exist that reduce the defects of perovskite films: One passivates the perovskite film surface to reduce the surface defects, e.g., aromatic formamidiniums, potassium chloride, ammonium iodide butyrate, phenethylamine, and choline; − the other promotes perovskite crystallization, increases the crystal size, and improves the quality of the active layer to reduce the bulk defects in perovskite films, e.g., pyridine, caffeine, methylenediammonium dichloride, urea, methylammonium acetate, and methylammonium chloride (MACl). − Fewer grain boundaries arising from enlarged grains reduce the carrier recombination at the boundaries, prolong the carrier lifetime, improve the carrier mobility, and reduce the overall nonradiative losses in a PSC, which ultimately improves the PCE and stability. − To enhance the quality of perovskite films, researchers have developed methods involving SnO 2 modification or the inclusion of an additive in perovskite precursor solutions. As Cl addition to a perovskite precursor solution retarded perovskite formation, , Cl addition to a PbI 2 film using sequential deposition should decrease the number of nucleation sites and increase the grain size.…”