2000
DOI: 10.1117/12.382107
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Residual oxygen contamination of InAlGaAs SQW high-power laser diodes

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Cited by 5 publications
(8 citation statements)
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“…All growth parameters were also kept as constant as possible. 8 The same trends were seen as in the AlInAs growth study detailed above. The first studies compared solid adduct purified TMI with Solution TMI made from adduct purified TMI.…”
Section: Laser Resultssupporting
confidence: 61%
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“…All growth parameters were also kept as constant as possible. 8 The same trends were seen as in the AlInAs growth study detailed above. The first studies compared solid adduct purified TMI with Solution TMI made from adduct purified TMI.…”
Section: Laser Resultssupporting
confidence: 61%
“…Full details of the growth structure, the device processing and discussion of the device results have been published elsewhere. 8 The results are reproduced here in Fig. 8 (which shows the optical power verses current plot (P/ I) for 1200 µm × 150 µm oxide stripe defined lasers without facet coating [measured at 15°C]) and Fig.…”
Section: Laser Resultsmentioning
confidence: 81%
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“…The addition of indium into the AlGaAs quantum well (QW) suppresses the propagation of dislocations as the bulk degradation mechanism in Al-containing QW-laser devices and introduces a considerable amount of compressive strain leading to larger maximum output powers 5 and better reliability. 6 A 1.2 W continuous wave (cw) output power at 743 nm over 2000 h (100 mm stripe width) has been demonstrated with a QW containing 15% In. 6 For a long time it has been reported that oxygen incorporated into the Al-containing active regions degrades the laser performance.…”
Section: Introductionmentioning
confidence: 99%