1987
DOI: 10.1364/ao.26.002676
|View full text |Cite
|
Sign up to set email alerts
|

Residual errors in laser interferometry from air turbulence and nonlinearity

Abstract: Laser displacement interferometry is used extensively in precision equipment for semiconductor manufacture. In these applications it is often necessary to introduce a high velocity airflow to the measurement environment to minimize the density of airborne particulate contaminants. The performance of the heterodyne interferometer is degraded by the resulting fluctuations in the index of refraction along the beam path. The magnitude, correlation length, and probability distribution of the optical path length (OP… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
4
1

Citation Types

1
59
0

Year Published

1991
1991
2023
2023

Publication Types

Select...
6
2

Relationship

0
8

Authors

Journals

citations
Cited by 125 publications
(60 citation statements)
references
References 8 publications
1
59
0
Order By: Relevance
“…Heterodyne Michelson interferometers are prone to sub-periodic nonlinearity resulting from imperfect separation of the two frequencies by the primary beam splitter [26,27]. The periodic nonlinearity can be evaluated by pressure scanning the interferometer and recording the fringe advance vs pressure increa.se.…”
Section: Compariiioii Of Two Silicon Samplesmentioning
confidence: 99%
“…Heterodyne Michelson interferometers are prone to sub-periodic nonlinearity resulting from imperfect separation of the two frequencies by the primary beam splitter [26,27]. The periodic nonlinearity can be evaluated by pressure scanning the interferometer and recording the fringe advance vs pressure increa.se.…”
Section: Compariiioii Of Two Silicon Samplesmentioning
confidence: 99%
“…The underlying principle is to measure the phase variation of a single light wavelength with distance by employing homodyne [9][10][11][12] or heterodyne phase-measuring electronics [13][14][15][16]. This single wavelength method leads to incremental displacement measurement with nanometer-region sub-wavelength resolutions over extensive ranges up to several meters.…”
Section: Introductionmentioning
confidence: 99%
“…In heterodyne interferometer systems, periodic nonlinearities occurs as a consequence of optical mixing(polarization mixing or frequency mixing) and errors in the electronic phase meter [1][2][3][4][5][6][7][8][9]. Under unfavorable circumstances these errors may exceed 20 nm peak-to-peak.…”
Section: Introductionmentioning
confidence: 99%
“…Under unfavorable circumstances these errors may exceed 20 nm peak-to-peak. The nonlinearity of heterodyne interferometers is caused not only by polarization ellipticity or nonorthogonality of the laser beams, the imperfect optical parts can also contribute [1,2]. Hou [3] has proposed that the optical arrangement of interferometer could influence the nonlinearity.…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation