Research on Total Ionizing Dose Radiation Hardening by Design Method for Bandgap Reference Based on Real-Time Monitoring and Adaptive Compensation
Guo Zhongjie,
Ren Yuan,
Wang Yapeng
et al.
Abstract:Bandgap reference circuits can be affected by bipolar transistor base leakage currents and current gain degradation in Total-dose radiation environments. These factors can cause the output voltage of Bandgap reference to shift, which can make Bandgap reference less reliable. Aiming
at the problems of high cost, large layout area, and low universality that traditional total dose hardening methods for Bandgap reference based on process, layout, and device can bring, an on-chip total dose real-time monitoring an… Show more
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