Research on the Application of Portable X-ray Backscatter Imaging Technology in the Field of Non-destructive Testing of Crimped Power Fittings

Ni, Hongyu; Huang, Su; Huang, Wuhao; Wu, Zhimin; He, Chengbin; Zhu, Wenhuan

doi:10.1109/tocs56154.2022.10016157

2022 IEEE Conference on Telecommunications, Optics and Computer Science (TOCS) 2022

DOI: 10.1109/tocs56154.2022.10016157

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Research on the Application of Portable X-ray Backscatter Imaging Technology in the Field of Non-destructive Testing of Crimped Power Fittings

Hongyu Ni¹,

Su Huang

Wuhao Huang³

et al.

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Research on the Application of Portable X-ray Backscatter Imaging Technology in the Field of Non-destructive Testing of Crimped Power Fittings

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References 21 publications

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