Research on Test Parameters of Ultra High Resolution CMOS Image Sensor Microsystems

Tian, Yu; Liu, Pei; Rui, Erming; Jiao, Qiang; Xiong, Yuanyuan; Dong, Yanlei; Ma, Yue; Li, Junlin

doi:10.1109/icarce59252.2024.10492516

2023 2nd International Conference on Automation, Robotics and Computer Engineering (ICARCE) 2023

DOI: 10.1109/icarce59252.2024.10492516

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Research on Test Parameters of Ultra High Resolution CMOS Image Sensor Microsystems

Yu Tian,

Pei Liu,

Erming Rui

et al.

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Research on Test Parameters of Ultra High Resolution CMOS Image Sensor Microsystems

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