“…Other approaches studied include polarization control [47] and phase measurements [48,49] or both [50] to acquire an accurate reflectometry trace of the device under test. Some study has also been dedicated to other domain solutions such as Optical Wavelet Domain Reflectometry (OWDR) [51].…”
“…Other approaches studied include polarization control [47] and phase measurements [48,49] or both [50] to acquire an accurate reflectometry trace of the device under test. Some study has also been dedicated to other domain solutions such as Optical Wavelet Domain Reflectometry (OWDR) [51].…”
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