Research on characteristics measurement of infrared defect tester

Zhou, Taogeng; Zhang, Junchao; Meng, Haifeng; Cai, Chuan; He, Yan; Li, Xiaohui; Changshi, Wang; Keija, Zhang; Zhang, Bifeng; Xiong, Limin

doi:10.1117/12.2285194

AOPC 2017: Optoelectronics and Micro/Nano-Optics 2017

DOI: 10.1117/12.2285194

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Research on characteristics measurement of infrared defect tester

Taogeng Zhou¹,

Junchao Zhang²,

Haifeng Meng³

et al.

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