Research on Calculation Method of Radiation Response Eigenvalue of a Single-Chip Active Pixel Sensor

Abstract

In this paper, we present a calculation method for the radiation response eigenvalue based on a monolithic active pixel sensor. By comparing the statistical eigenvalues of different regions of a pixel array in bright and dark environments, the linear relationship between the statistical eigenvalues obtained by different algorithms and the radiation dose rate was studied. Additionally, a dose rate characterization method based on the analysis of the eigenvalues of the MAPS response signal was proposed. The experimental results show that in the dark background environment, the eigenvalues had a good linear response in the region of any gray value in the range of 10–30. In the color images, due to the difference in the background gray values in adjacent color regions, the radiation response signal in dark regions was confused with the image information in bright regions, resulting in the loss of response signal and affecting the analysis results of the radiation response signal. For the low dose rate radiation field, as the radiation response signal was too weak and there was background dark noise, it was necessary to accumulate frame images to obtain a sufficient response signal. For the intense radiation field, the number of response events in a single image was very high, and only two consecutive frames of image data needed to be accumulated to meet the statistical requirements. The binarization method had a good characterization effect for the radiation at a low dose rate, and the binarization processing and the total gray value statistics of the response data at a high dose rate could better characterize the radiation dose rate. The calibration experiment results show that the binarization processing method can meet the requirements of using a MAPS for wide-range detection.