Research of dynamic detecting the raw silk fineness on line by a linear CCD and FPGA

Abstract

A new design scheme has been proposed that aim to realize real time, on line raw silk diameter measurement based on linear CCD (Charge Coupled Device) and FPGA (Field Programmable Gate Array).In this system, the samples of raw silk are placed in parallel light which reflect light through macro imaging is received by CCD image sensor. The research on how to improve precision of the system from theoretical approach to various functional modules parameter optimization. What's more, effects are solved in instability of light illumination and raw silk transparency, linear CCD's dark background imaging is chosen to avoid bright background image easily saturation, distortion caused by raw silk jitter is eliminated. system measurement accuracy reaches to±1µm,experimental results prove that research programme has certain feasibility and practicality.

A Direct Measurement Method of Yarn Evenness Based on Machine Vision

“…Therefore, increasing numbers of methods are being studied for use in measuring yarn evenness. Some methods being developed may be more accurate, their operations may be easier, or their speeds may be faster [1][2][3][4][5].…”

“…The system consisted of a CCD camera which records the yarn shadow and a photo receiver which records the light diffused from the yarn. Using this system, the signal is used to express the change of the yarn diameter [8][9][10].…”

A Novel Method for Measuring the Evenness of Raw Silk

“…In recent years, with the development of optoelectronic technology, the range of the applications based on the CCD (Charge-coupled Device) sensors becomes wider and wider. Studies using this technique to detect the appearance of raw silk have been reported [1,2]. However, most of research are about processing the signal collected by CCD sensor rather then processing the image collected by CCD sensor.…”