2001
DOI: 10.1002/sia.1148
|View full text |Cite
|
Sign up to set email alerts
|

Reproducibility in r.f.‐GDOES depth profiling analysis of thin films

Abstract: The reproducibility in radiofrequency glow discharge optical emission spectroscopy (r.f.-GDOES) depth profiling has been examined using a 360 nm thick anodic alumina film with a chromium-containing delta-function layer. The time required to sputter through the film was constant, to within 1%, whereas the signal intensities of film species agreed to within 3%. This level of reproducibility together with high depth resolution makes the technique ideal for on-site quality control of various surface-enhanced indus… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

0
4
0

Year Published

2003
2003
2015
2015

Publication Types

Select...
4

Relationship

2
2

Authors

Journals

citations
Cited by 4 publications
(4 citation statements)
references
References 13 publications
0
4
0
Order By: Relevance
“…Plate 1(b) shows the depth profiles for aluminium and chromium, without any data manipulation, obtained from the five different areas of a single specimen. 7 Here, the sputtering time was converted directly to the depth, assuming that the sputtering rate was constant throughout the analysis of the oxide film. The profiles were recorded at an argon pressure of 680 Pa and a power of 40 W. Similar results were obtained for repeated measurements on other specimens anodized in a similar manner.…”
Section: Introductionmentioning
confidence: 99%
“…Plate 1(b) shows the depth profiles for aluminium and chromium, without any data manipulation, obtained from the five different areas of a single specimen. 7 Here, the sputtering time was converted directly to the depth, assuming that the sputtering rate was constant throughout the analysis of the oxide film. The profiles were recorded at an argon pressure of 680 Pa and a power of 40 W. Similar results were obtained for repeated measurements on other specimens anodized in a similar manner.…”
Section: Introductionmentioning
confidence: 99%
“…1. Reproducibility of the emission intensity profiles is not presented here but is about 1% RSD [27] for given abrasion conditions and similar samples. The shape of this profile can be divided into 4 main areas corresponding to the different sublayers of the materials.…”
Section: Resultsmentioning
confidence: 93%
“…5. Comparison of profiles, which is possible due to the high reproducibility of GDOES, 11 reveals no significant changes due to annealing. The emission line of boron at 249.678 nm is close to that of niobium at 249.698 nm.…”
Section: Depth Profile Analysis By Gdoesmentioning
confidence: 99%
“…Boron species, incorporated into the film and present in the outer 15% of the film thickness, thus migrate outwards at ¾0.6 times the rate of Nb 5C ions. 11 Hydrogen species are also present in the outer part of the film Intensity/arb. unit Figure 5.…”
Section: Depth Profile Analysis By Gdoesmentioning
confidence: 99%