Abstract:A new phase defect repair technique of phase-shifting masks made using conventional chrome-on-quartz blanks is proposed. This technique is based on the planarization of defects and dry etching of the defective area under conditions where the planarization layer etch rate is made equal to the quartz etch rate. The process consists of defining an opening on top of the defective area of the mask in a photoresist layer covering the planarization layer using UV exposure. Phase defects can, therefore, be etched away… Show more
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