Removing the effects of elastic and thermal scattering from electron energy-loss spectroscopic data

Lugg, Nathan; Haruta, Mitsutaka; Neish, M. J.; Findlay, Scott; Mizoguchi, Teruyasu; Kimoto, Koji; Allen, L. J.

doi:10.1063/1.4765657

Cited by 26 publications

(17 citation statements)

References 19 publications

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“…This discrepancy may be associated with the shorter Cu(1)-O(4) bond length (1.833 Å) relative to the Cu(1)-O(1) bond (1.940 Å), and potentially a role of strong correlation effects altering the expected electronic structure. An additional consideration is related to the dynamics of electron scattering as the probe propagates in the sample, generating some contributions from adjacent sites, as shown recently in La 2 CuO 4 by Lugg and co-workers 24 . The second discrepancy relates to the presence of the peak b at 934.5 eV in the Cu L chain layer of fully doped YBCO 7 .…”

Section: Discussionmentioning

confidence: 99%

Atomic scale real-space mapping of holes in YBa2Cu3O6+δ

et al. 2014

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The high-temperature superconductor YBa 2 Cu 3 O 6 þ d consists of two main structural units-a bilayer of CuO 2 planes that are central to superconductivity and a CuO 2 þ d chain layer. Although the functional role of the planes and chains has long been established, most probes integrate over both, which makes it difficult to distinguish the contribution of each. Here we use electron energy loss spectroscopy to directly resolve the plane and chain contributions to the electronic structure in YBa 2 Cu 3 O 6 and YBa 2 Cu 3 O 7 . We directly probe the charge transfer of holes from the chains to the planes as a function of oxygen content, and show that the change in orbital occupation of Cu is large in the chain layer but modest in CuO 2 planes, with holes in the planes doped primarily into the O 2p states. These results provide direct insight into the local electronic structure and charge transfers in this important high-temperature superconductor.

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Section: Discussionmentioning

confidence: 99%

Atomic scale real-space mapping of holes in YBa2Cu3O6+δ

et al. 2014

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“…We also wish to draw a comparison with an alternative procedure for removing elastic and thermal diffuse scattering effects from electron energy-loss spectra proposed by Lugg et al 32 . Their method has the advantage of removing these effects from the individual spectra, enabling access to both elemental maps and energy-loss near-edge structure, for example.…”

Section: Restoration Of Chemical Contrastmentioning

confidence: 99%

Energy-loss- and thickness-dependent contrast in atomic-scale electron energy-loss spectroscopy

et al. 2014

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Atomic-scale elemental maps of materials acquired by core-loss inelastic electron scattering often exhibit an undesirable sensitivity to the unavoidable elastic scattering, making the maps counterintuitive to interpret. Here, we present a systematic study that scrutinizes the energy-loss and sample-thickness dependence of atomic-scale elemental maps acquired using 100 keV incident electrons in a scanning transmission electron microscope. For single-crystal silicon, the balance between elastic and inelastic scattering means that maps generated from the near-threshold Si-L signal (energy loss of 99 eV) show no discernible contrast for a thickness of 0.5λ (λ is the electron mean-free path, here approximately 110 nm). At greater thicknesses we observe a counter-intuitive "negative" contrast. Only at much higher energy losses is an intuitive "positive" contrast gradually restored. Our quantitative analysis shows that the energy-loss at which a positive contrast is restored depends linearly on the sample thickness. This behaviour is in very good agreement with our doublechanneling inelastic scattering calculations. We test a recently-proposed experimental method to correct the core-loss inelastic scattering and restore an intuitive "positive" chemical contrast. The method is demonstrated to be reliable over a large range of energy losses and sample thicknesses. The corrected contrast for near-threshold maps is demonstrated to be (desirably) inversely proportional to sample thickness. Implications for the interpretation of atomic-scale elemental maps are discussed.

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“…With the advent of aberration-correction [9,10], sub-angstrom STEM electron beams can be combined with EDX or electron energy-loss spectroscopy (EELS) to rapidly map solids with crisp atomic resolution [11][12][13][14]. Efforts to retrieve sub-atomic information from STEM-EELS spectrum images have been made [15,16], and the concept that core-level orbital information can be determined by deconvolving channeled STEM probes from spectrum images has also been discussed [16][17][18][19], both led by Allen and coworkers. However, acquiring experimental low-noise, atomic-resolution maps for such analyses has been challenging, and the outcomes have been suitable only for basic qualitative interpretation.…”

Section: Introductionmentioning

confidence: 99%

Probing core-electron orbitals by scanning transmission electron microscopy and measuring the delocalization of core-level excitations

Jeong

Odlyzko

et al. 2016

Phys. Rev. B

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By recording low-noise energy-dispersive X-ray spectroscopy maps from crystalline specimens using aberration-corrected scanning transmission electron microscopy, it is possible to probe core-level electron orbitals in real-space. Both the 1s and 2p orbitals of Sr and Ti atoms in SrTiO 3 are probed and their projected excitation potentials are determined. This study also demonstrates experimental measurement of the electronic excitation impact parameter, the delocalization of an excitation due to coulombic beam-orbital interaction.2

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Removing the effects of elastic and thermal scattering from electron energy-loss spectroscopic data

Cited by 26 publications

References 19 publications

Atomic scale real-space mapping of holes in YBa2Cu3O6+δ

Atomic scale real-space mapping of holes in YBa2Cu3O6+δ

Energy-loss- and thickness-dependent contrast in atomic-scale electron energy-loss spectroscopy

Probing core-electron orbitals by scanning transmission electron microscopy and measuring the delocalization of core-level excitations

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