2019
DOI: 10.1016/j.measurement.2018.08.043
|View full text |Cite
|
Sign up to set email alerts
|

Remarks concerning about the characteristics of the extractor vacuum gauge and the Quadrupole Mass Spectrometer

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

1
3
0

Year Published

2020
2020
2023
2023

Publication Types

Select...
6

Relationship

0
6

Authors

Journals

citations
Cited by 6 publications
(4 citation statements)
references
References 10 publications
1
3
0
Order By: Relevance
“…Finally, the mean sensitivity values of non-sensitive to pressure ranges and the sensitivity factors relative to N 2 are computed and summarized in table 3. The relative sensitivities are compared with the values of previous studies [15,22], and the findings have a similar tendency to that observed in previous reports.…”
Section: Qms Sensitivity Calibrationsupporting
confidence: 80%
See 1 more Smart Citation
“…Finally, the mean sensitivity values of non-sensitive to pressure ranges and the sensitivity factors relative to N 2 are computed and summarized in table 3. The relative sensitivities are compared with the values of previous studies [15,22], and the findings have a similar tendency to that observed in previous reports.…”
Section: Qms Sensitivity Calibrationsupporting
confidence: 80%
“…As one of the core components of the dynamic expansion system, the conductance elements include small tube 29 and circular orifice 34. The small tube 29 was made by laser drilling of stainless steel SUS316L, which was also melted in a vacuum to reduce its hydrogen content and has good thermal and mechanical stability under one-atmosphere pressure [15]. To minimize the pressure gradients within the calibration chamber, the diameter of orifice 34 is designed to be 11 mm.…”
Section: Dynamic Expansion Systemmentioning
confidence: 99%
“…The thermionic electron sources operating in the Schottky current range used in gas ion sources generate an ionizing electron beam with a specific intensity and energy. They are widely used in many measuring tools, such as apparatus for ionization cross-section measurements [ 1 , 2 , 3 ], ionization gauges [ 4 , 5 ], mass spectrometers, and in microelectromechanical systems (MEMS) technology [ 6 , 7 ]. Electron beam ion source technology has been applied in the Relativistic Heavy Ion Collider at Brookhaven National Laboratory [ 8 ].…”
Section: Introductionmentioning
confidence: 99%
“…However, as the ratio of the ion current over the electron beam current is measured, the need for electron beam current stabilization can be eliminated, for example, in cross-section measurements [ 1 , 2 , 3 ]. In ionization gauges and mass spectrometers, for the high stability of sensitivity and repeatability of measurement results [ 4 , 5 ], the electron beam current and accelerating voltage should be maintained at preset constant values, and, therefore, both quantities must be perfectly stabilized, which complies with the concept of the cognitive process in metrology [ 10 ]. It should be noted that, in some instruments, such as mass spectrometers, the Klopfer ionization gauge [ 5 ], only a part of the electron beam current collected by a trap electrode, as a true ionizing current, should be stabilized [ 11 ].…”
Section: Introductionmentioning
confidence: 99%