2021
DOI: 10.1039/d1ra04012j
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Remarkable damage in talc caused by electron beam irradiation with a dose of up to 1000 kGy: lattice shrinkage in the Z- and Y-axis and corresponding intrinsic microstructural transformation process speculation

Abstract: Upon irradiation, tetrahedral Si–O and the links of tetrahedron and octahedron sheets are cleaved, leading to shrinkage and amorphization. That in the Z-axis is more pronounced than in the Y-axis.

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Cited by 8 publications
(3 citation statements)
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References 57 publications
(60 reference statements)
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“…If they were mainly derived from H 2 O radiolysis, valance reduction can be feasible. This situation is feasible as H 2 O radiolysis cannot be avoided under EB irradiation 42,44,51,52 . Considering these aspects comprehensively, it concludes to 1000 kGy‐irradiated species dehydroxylation is extensive accompanied with H 2 O radiolysis.…”
Section: Resultsmentioning
confidence: 99%
“…If they were mainly derived from H 2 O radiolysis, valance reduction can be feasible. This situation is feasible as H 2 O radiolysis cannot be avoided under EB irradiation 42,44,51,52 . Considering these aspects comprehensively, it concludes to 1000 kGy‐irradiated species dehydroxylation is extensive accompanied with H 2 O radiolysis.…”
Section: Resultsmentioning
confidence: 99%
“…The subtracted graphs are also presented in Figure 2a. The diffraction peaks of talc at 9.47 • , 18.95 • , and 28.64 • are related to the interlayer space of talc corresponding, respectively, to the (002), (004), and (006) planes [32,33]. As can be seen in Figure 2a, the subtracted graph referring to the talc modified at 12 • C exhibits clear negative peaks at the abovementioned angles, indicating that the intensity of these peaks is reduced in the modified sample.…”
Section: Talc Modificationmentioning
confidence: 99%
“…[ 137 ] However, some researchers reported that the (100)‐oriented PZ and Pb(Nb,Zr,Sn,Ti)O 3 anti‐ferroelectric films obtain the high maximum polarization, which was attributed to the internal stress and the field induced phase transition. [ 90,159,160 ]…”
Section: Optimizing Of Processmentioning
confidence: 99%