Reliability tests on millimetre wave 100 nm gate length process for safe operating area evaluation methodology

Robin, C.; Delcourt, S.; Theocharis, J.; Neyrolles, K.; Langrez, D.; Latti, J.; Papaioannou, G.

doi:10.1016/j.microrel.2023.115230

Microelectronics Reliability

2023

DOI: 10.1016/j.microrel.2023.115230

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Reliability tests on millimetre wave 100 nm gate length process for safe operating area evaluation methodology

C. Robin,

S. Delcourt,

J. Theocharis

et al.

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Reliability tests on millimetre wave 100 nm gate length process for safe operating area evaluation methodology

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References 9 publications

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