2006
DOI: 10.1515/eqc.2006.279
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Reliability Test Plans for Exponentiated Log-Logistic Distribution

Abstract: A generalization of the log-logistic distribution called exponentiated log-logistic distribution (in lines of exponentiated Weibull distribution suggested by Mudholkar and Srivastava [2]) is considered. In this paper the operating characteristic for a sampling plan is determined for the case that a lot of products is submitted for inspection with lifetimes specified by an exponentiated log-logistic distribution (ELLD). The results are illustrated by a numerical example.

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Cited by 61 publications
(38 citation statements)
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“…Several researchers have proposed single acceptance sampling plans for various lifetime distributions. One may refer to, among others, Epstein (1954) for exponential distribution, Goode and Kao (1961) for Weibull distribution, Gupta (1962) for normal and lognormal distributions, Rosaiah and Kantam (2005) for inverse Rayleigh distribution, Rosaiah et al (2006) for exponentiated loglogistic distribution, Tsai and Wu (2006) for generalized Rayleigh distribution, Balakrishnan et al (2007) and Lio et al (2010) for generalized Birnbaum-Saunders distribution and for generalized exponential distribution. A generalization of the single acceptance sampling plan is known as the double acceptance sampling plan.…”
Section: Introductionmentioning
confidence: 99%
“…Several researchers have proposed single acceptance sampling plans for various lifetime distributions. One may refer to, among others, Epstein (1954) for exponential distribution, Goode and Kao (1961) for Weibull distribution, Gupta (1962) for normal and lognormal distributions, Rosaiah and Kantam (2005) for inverse Rayleigh distribution, Rosaiah et al (2006) for exponentiated loglogistic distribution, Tsai and Wu (2006) for generalized Rayleigh distribution, Balakrishnan et al (2007) and Lio et al (2010) for generalized Birnbaum-Saunders distribution and for generalized exponential distribution. A generalization of the single acceptance sampling plan is known as the double acceptance sampling plan.…”
Section: Introductionmentioning
confidence: 99%
“…Studies regarding truncated life tests can be found in Epstein [1], Sobel and Tischendrof [2], Goode and Kao [3], Gupta and Groll [4], Gupta [5], Fertig and Mann [6], Kantam and Rosaiah [7], Baklizi [8], Wu and Tsai [9], Rosaiah and Kantam [10], Rosaiah et al [11], Tsai and Wu [12], Balakrishnan et al [13], Srinivasa Rao et al [14], Srinivasa Rao et al [15], Aslam et al [16], and Srinivasa Rao et al [17]. All these authors designed acceptance sampling plans based on the mean life time under a truncated life test.…”
Section: Introductionmentioning
confidence: 99%
“…It is implicitly assumed in the usual sampling plans that only a single item is put in a tester. Acceptance sampling on the basis of single item by using the various lifetime distribution are discussed by many authors Epstein (1954), Goode and Kao (1961), Kantam and Rosaiah (1998), Kantam et al (2001), Baklizi (2003), Rosaiah et al (2006), Rosaiah and Kantam (2005), Tsai and Wu (2006), Rosaiah et al (2007), Aslam and Shahbaz (2007), Aslam and Kantam (2008), and Balakrishnan et al (2007), Aslam and Jun (2010). However, the tester wants to test multiple numbers of items at a time because testing cost and time can be saved by testing these items simultaneously.…”
Section: Introductionmentioning
confidence: 99%