Reliability study of 850 nm VCSELs for data communications

Hawthorne, Robert A.; Guenter, James K.; Granville, David N.; Hibbs‐Brenner, Mary K.; Morgan, Robert

doi:10.1109/relphy.1996.492120

Cited by 15 publications

(4 citation statements)

References 8 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The dependence of reliability on current density and junction temperature for VCSELs is well known and expressed as [5–10]

t_{f} = A J^{- N} \exp (][, E_{a} / false(k T_{j} false))

where t f is the failure time, A is a scaling factor, J is the current density, E a is the activation energy, k is the Boltzmann constant, T j is the junction temperature and N is the current acceleration factor. The junction temperature T j in the exponential term will mostly affect the time to fail and is the focus of this Letter.…”

Section: Reliability Test Discussion and Resultsmentioning

confidence: 99%

“…The 3 µm oxide VCSELs are produced in volume and are expected to provide an excellent benchmark on the level of reliability that can be achieved with commercial oxide VCSELs under extreme operating conditions. Reliability test discussion and results: The dependence of reliability on current density and junction temperature for VCSELs is well known and expressed as [5][6][7][8][9][10]…”

mentioning

confidence: 99%

See 1 more Smart Citation

Stress test of lithographic vertical‐cavity surface‐emitting lasers under extreme operating conditions

Zhao

et al. 2015

Electron. lett.

View full text Add to dashboard Cite

Reliability test data are presented, which show that non-oxide alllithographic vertical-cavity surface-emitting lasers (VCSELs) are more reliable than oxide VCSELs under extreme operating conditions. The test data are compared for lithographic and oxide VCSELs of 3 µm size after operating at a stage temperature of 150°C and an injection current density of 140 kA/cm 2 for various times. The increased reliability under extreme operating conditions can be largely attributed to the lower junction temperature and the internal stress inside lithographic VCSELs.

show abstract

“…The dependence of reliability on current density and junction temperature for VCSELs is well known and expressed as [5–10]

t_{f} = A J^{- N} \exp (][, E_{a} / false(k T_{j} false))

Section: Reliability Test Discussion and Resultsmentioning

confidence: 99%

mentioning

confidence: 99%

Stress test of lithographic vertical‐cavity surface‐emitting lasers under extreme operating conditions

Zhao

et al. 2015

Electron. lett.

View full text Add to dashboard Cite

show abstract

“…The optical output power of a VCSEL was defined as the photocurrent of a calibrated monitoring photodiode. The failure of the VCSELs is defined by a 3 dBdecrement in optical output power or a 50% change of the threshold current compared to the initially measured value [1][2]. The room temperature threshold current under each aging condition is displayed as a function of time in Figure 2.…”

Section: Reliability Testingmentioning

confidence: 99%

Reliability Assessment of 1.55-μM Vertical Cavity Surface Emitting Lasers for Optical Communication Systems

Rhew

Jeon

Kwon

et al. 2007

2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual

View full text Add to dashboard Cite

In this paper, the long-term reliability of all monolithic 1.55-ptm vertical cavity surface emitting lasers (VCSELs) is investigated. High-temperature storage tests and accelerated life tests are used to evaluate long-term VCSEL reliability. Variations of properties that depend on the operating conditions are characterized via the threshold current, the dark current, and the optical output power. The median device lifetime is extrapolated and the activation energy of the degradation mechanism for the VCSEL test structures is calculated. From these results, the long-term reliability of the VCSEL test structures for high-speed optical communication systems can be determined. [Keywords: vertical cavity surface emitting laser, long-term reliability, accelerated life test.]

show abstract

“…Extensive work on the reliability of VCSELs has been performed by experts and scholars. As early as 1996 [4], the reliability of 850 nm VCSELs applications in the field of communication was analyzed by Hawthorne III et al In 2013, The associate editor coordinating the review of this manuscript and approving it for publication was Cristian Zambelli .…”

Section: Introductionmentioning

confidence: 99%

Reliability Analysis of Vertical Cavity Surface-Emitting Lasers Based on the Gamma Process

Luo

2020

IEEE Access

View full text Add to dashboard Cite

Due to the long life and high reliability of vertical cavity surface-emitting lasers, the performance degradation experiment cost is high, and the experiment cycle is long, because the degradation failure process of a semiconductor laser is a monotonic decreasing process, and the amount of performance degradation is independent for each function. Therefore, based on the Gamma process, the degradation performance of vertical cavity surface-emitting lasers has been modeled and analyzed in this paper. First, a model is given based on the Gamma process. Then, the failure distribution of the product is determined by analyzing the first arrival time distribution of the process, and then, the reliability of the product is statistically deduced to determine the residual life distribution of the device. Finally, combined with the data obtained from accelerated aging experiments, the product failure time of 261 470 hours is deduced, approximately 30 years. The model is in good agreement with the experimental results, which proves the validity of the model and provides a theoretical basis for the analysis of the reliability of the vertical cavity surface-emitting laser. According to the model, the reliability of the device decreases to 0.9994 after 100 000 hours of operation.

show abstract

Reliability study of 850 nm VCSELs for data communications

Cited by 15 publications

References 8 publications

Stress test of lithographic vertical‐cavity surface‐emitting lasers under extreme operating conditions

Stress test of lithographic vertical‐cavity surface‐emitting lasers under extreme operating conditions

Reliability Assessment of 1.55-μM Vertical Cavity Surface Emitting Lasers for Optical Communication Systems

Reliability Analysis of Vertical Cavity Surface-Emitting Lasers Based on the Gamma Process

Contact Info

Product

Resources

About

Reliability study of 850 nm VCSELs for data communications

Cited by 15 publications

References 8 publications

Stress test of lithographic vertical‐cavity surface‐emitting lasers under extreme operating conditions

Stress test of lithographic vertical‐cavity surface‐emitting lasers under extreme operating conditions

Reliability Assessment of 1.55-&#x003BC;M Vertical Cavity Surface Emitting Lasers for Optical Communication Systems

Reliability Analysis of Vertical Cavity Surface-Emitting Lasers Based on the Gamma Process

Contact Info

Product

Resources

About

Reliability Assessment of 1.55-μM Vertical Cavity Surface Emitting Lasers for Optical Communication Systems