Reliability of high performance 9xx-nm single emitter laser diodes

Bao, Ling; Wang, Jun; DeVito, Mark; Xu, Dehui; Wise, Damian; Leisher, Paul O.; Grimshaw, Mike; Dong, Weimin; Zhang, Shiguo; Price, Kirk; Li, Daming; Bai, Chendong; Patterson, Steve; Martinsen, R.

doi:10.1117/12.842856

Cited by 16 publications

(10 citation statements)

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Section: Introductionmentioning

confidence: 99%

“…Imaging through a window opened in the metallization on the substrate (n) side of a p-side down mounted emitter has provided valuable insight into both COMD [2,3] and COBD failure mechanisms [1,4]. Various analytical techniques [1][2][3][4] such as electroluminescence (EL), cathodoluminescence (EBIC, (S)TEM and FIB/SEM [4]), microphotoluminescence (μ-PL) [2] (including time resolved), and deep level transient spectroscopy (DLTS) [4], have been employed to characterize failure sites inside the emitter, which are observed typically as dark line defects (DLDs) extending over a significant length of the laser cavity. DLDs were found to be consistent with ring cavity modes [3], and contain non-radiative defects such as EL2 traps [4].…”

Section: Introductionmentioning

confidence: 99%

“…Whilst facet passivation techniques can effectively suppress or delay catastrophic optical mirror damage (COMD) extending emitter reliability into several hundreds thousands of hours, other, less dominant, failure modes such as intra-chip catastrophic optical bulk damage (COBD) become apparent [1]. Imaging through a window opened in the metallization on the substrate (n) side of a p-side down mounted emitter has provided valuable insight into both COMD [2,3] and COBD failure mechanisms [1,4]. Various analytical techniques [1][2][3][4] such as electroluminescence (EL), cathodoluminescence (EBIC, (S)TEM and FIB/SEM [4]), microphotoluminescence (μ-PL) [2] (including time resolved), and deep level transient spectroscopy (DLTS) [4], have been employed to characterize failure sites inside the emitter, which are observed typically as dark line defects (DLDs) extending over a significant length of the laser cavity.…”

Section: Introductionmentioning

confidence: 99%

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Multi-spectral investigation of bulk and facet failures in high-power single emitters at 980 nm

et al. 2013

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Reliable single emitters delivering >10W in the 9xx nm spectral range, are common building blocks for fiber laser pumps. As facet passivation techniques can suppress or delay catastrophic optical mirror damage (COMD) extending emitter reliability into hundreds of thousands of hours, other, less dominant, failure modes such as intra-chip catastrophic optical bulk damage (COBD) become apparent. Based on our failure statistics in high current operation, only ~52% of all failures can be attributed to COMD. Imaging through a window opened in the metallization on the substrate (n) side of a p-side down mounted emitter provides valuable insight into both COMD and COBD failure mechanisms.We developed a laser ablation process to define a window on the n-side of an InGaAs/AlGaAs 980nm single emitter that is overlaid on the pumped 90µm stripe on the p-side. The ablation process is compatible with the chip wire-bonding, enabling the device to be operated at high currents with high injection uniformity.We analyzed both COMD and COBD failed emitters in the electroluminescence and mid-IR domains supported by FIB/SEM observation. The ablated devices revealed branching dark line patterns, with a line origin either at the facet center (COMD case) or near the stripe edge away from the facet (COBD case). In both cases, the branching direction is always toward the rear facet (against the photon density gradient), with SEM images revealing a disordered active layer structure. Absorption levels between 0.22eV -0.55eV were observed in disordered regions by FT-IR spectroscopy. Temperature mapping of a single emitter in the MWIR domain was performed using an InSb detector. We also report an electroluminescence study of a single emitter just before and after failure.

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Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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Multi-spectral investigation of bulk and facet failures in high-power single emitters at 980 nm

et al. 2013

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“…Whilst facet passivation techniques can effectively suppress or delay catastrophic optical mirror damage (COMD) extending emitter reliability into several hundreds thousands of hours, other, less dominant, failure modes such as intra-chip catastrophic optical bulk damage (COBD) become apparent [1]. Imaging through a window opened in the metallization on the substrate (n) side of a p-side down mounted emitter has provided valuable insight into both COMD [2], [3] and COBD failure mechanisms [1], [4]. Various analytical techniques [1]- [4] such as electroluminescence (EL), cathodoluminescence (EBIC, (S)TEM and FIB/SEM [4]), micro-photoluminescence (μ-PL) [2] (including time resolved), and deep level transient spectroscopy (DLTS) [4], have been employed to characterize failure sites inside the emitter, which are observed typically as dark line defects (DLDs) extending over a significant length of the laser cavity.…”

Section: Introductionmentioning

confidence: 99%

“…Imaging through a window opened in the metallization on the substrate (n) side of a p-side down mounted emitter has provided valuable insight into both COMD [2], [3] and COBD failure mechanisms [1], [4]. Various analytical techniques [1]- [4] such as electroluminescence (EL), cathodoluminescence (EBIC, (S)TEM and FIB/SEM [4]), micro-photoluminescence (μ-PL) [2] (including time resolved), and deep level transient spectroscopy (DLTS) [4], have been employed to characterize failure sites inside the emitter, which are observed typically as dark line defects (DLDs) extending over a significant length of the laser cavity. DLDs were found to be consistent with ring cavity modes [2], and contain non-radiative defects such as EL2 traps [4].…”

Section: Introductionmentioning

confidence: 99%

Multi-spectral investigation of bulk and facet failures in high-power single emitters at 980 nm

Yanson

Cohen

Levy

et al. 2012

ISLC 2012 International Semiconductor Laser Conference

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Failure mode characterizations of semiconductor lasers

Ren,

Li,

Qiu

et al. 2023

AIP Advances

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Catastrophic optical mirror damage (COMD) and catastrophic optical bulk damage (COBD) are the main factors that affect the reliability of semiconductor lasers. In this paper, we characterize the COMD and COBD failure modes by examining the voltage changes at the current point where failure occurs, as well as by using the electroluminescent technique. Our study reveals that the voltage has an increase at the failure current point for COMD samples, in which failure occurs due to the damage to the facet mirrors; for COBD samples, in which failure occurs inside the laser cavity, the voltage exhibits a decrease and the amount of voltage decrease is roughly proportional to the size of the damaged area.

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Reliability of high performance 9xx-nm single emitter laser diodes

Cited by 16 publications

References 0 publications

Multi-spectral investigation of bulk and facet failures in high-power single emitters at 980 nm

Multi-spectral investigation of bulk and facet failures in high-power single emitters at 980 nm

Multi-spectral investigation of bulk and facet failures in high-power single emitters at 980 nm

Failure mode characterizations of semiconductor lasers

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