2014 IEEE International Conference on Advanced Communications, Control and Computing Technologies 2014
DOI: 10.1109/icaccct.2014.7019461
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Reliability of different levels of cascaded H-Bridge inverter: An investigation and comparison

Abstract: This paper presents the comparative analysis of reliability of different levels of cascaded H -Bridge inverter topologies. Failure of single IGBT in a cell of H-Bridge can determine the reliability of the complete cell. Military Handbook-217F provides basis for computation of reliability of semiconductors. This method is not applicable for reliability evaluation of IGBT. To determine the temperature cycles of IGBT, thermal impedance model is developed and power cycles are obtained by using transfer function in… Show more

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Cited by 4 publications
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“…The reliability of stand-by systems with redundancy, featuring ideal switching without repair and constant and identical failure rates, can be described by the Poisson distribution (9) [50].…”
Section: Reliability Evaluationmentioning
confidence: 99%
“…The reliability of stand-by systems with redundancy, featuring ideal switching without repair and constant and identical failure rates, can be described by the Poisson distribution (9) [50].…”
Section: Reliability Evaluationmentioning
confidence: 99%