Reliability of CMOS-Compatible Ti / n-InP and Ti / p-InGaAs Ohmic Contacts for Hybrid III-V / Si Lasers

Boyer, F.; Jany, C.; Fonseca, J. Da; Szelag, B.; Amalberg, V.; Gregoire, M.; Rafhay, Q.; Rodriguez, Philippe

doi:10.1109/group4.2019.8926115

2019 IEEE 16th International Conference on Group IV Photonics (GFP) 2019

DOI: 10.1109/group4.2019.8926115

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Reliability of CMOS-Compatible Ti / n-InP and Ti / p-InGaAs Ohmic Contacts for Hybrid III-V / Si Lasers

F. Boyer¹,

C. Jany²,

J. Da Fonseca³

et al.

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Reliability of CMOS-Compatible Ti / n-InP and Ti / p-InGaAs Ohmic Contacts for Hybrid III-V / Si Lasers

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