Reliability growth by failure mode removal

“…[4][5] The development of self-lubricating liners requires multiple batches of reliability growth tests, among which the accelerated life test (ALT) is the primary method. 6 The finalization of a product generally requires assessments under service conditions to ensure that it can meet service index requirements. Considering the influence of the precision forming of the outer ring and other processes on the service life of the self-lubricating liner, higher standards have been proposed which required the use of high-end self-lubricating spherical plain bearings that exhibit high reliability.…”

Section: Introductionmentioning

confidence: 99%

Life prediction of heavy-load self-lubricating liners

Hao

Wang

Pan

2021

Advances in Mechanical Engineering

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To address the issues of long testing periods and small sample sizes while evaluating the service life of heavy-load self-lubricating liners, we propose a succinct method based on Monte Carlo simulation that is significantly fast and requires a small sample size. First, the support vector regression algorithm was applied to fit the degradation trajectories of the wear depth, and the first and second characteristic parameter vectors of the wear depth as well as the corresponding distribution models were obtained. Next, sample expansion was performed using Monte Carlo simulation and the inverse transform method. Finally, based on the failure criterion of the self-lubricating liner, the service lives and distribution models of the expanded samples were obtained; subsequently, the corresponding reliability life indices were provided. Our results indicate that when the expanded sample was large enough, the proposed prediction method exhibited a relatively high prediction accuracy. Therefore, these results provide theoretical support for shortening the testing cycle used to evaluate the service life of self-lubricating liners and for accelerating the research and development of self-lubricating spherical plain bearing products.

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“…Environmental stresses applied to electronic modules cause degradation both in components and assembly (soldering), which leads to failure, especially at weaker links [6]. A one-shot system usually has long service and high-reliability requirements, and therefore failure-based removals by studying failure mechanisms help to achieve high reliability during the entire service life [7,8]. Reliability analysis and RUL estimation of small electronic explosive detonators (devices) also called EEDs is a critical issue in the field of safety and reliability due to the high risk in the case of failure.…”

Section: Introductionmentioning

confidence: 99%

Reliability and Remaining Life Assessment of an Electronic Fuze Using Accelerated Life Testing

et al. 2020

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An electronic fuze is a one-shot system that has a long storage life and high mission criticality. Fuzes are designed, developed, and tested for high reliability (over 99%) with a confidence level of more than 95%. The electronic circuit of a fuze is embedded in the fuze assembly, and thus is not visible. Go/NoGo fuze assembly mission critical testing does not provide prognostic information about electrical and electronic circuits and subtle causes of failure. Longer storage times and harsh conditions cause degradation at the component level. In order to calculate accrued damage due to storage and operational stresses, it is necessary to perform sample-based accelerated life testing after a certain time and estimate the remaining useful life of mission critical parts. Reliability studies of mechanical parts of such systems using nondestructive testing (NDT) have been performed, but a thorough investigation is missing with regards to the electronic parts. The objective of this study is to identify weak links and estimate the reliability and remaining useful life of electronic and detonating parts. Three critical components are identified in an electronic fuze circuit (1) a diode, (2) a capacitor, and (3) a squib or detonator. The accelerated test results reveal that after ten years of storage life, there is no significant degradation in active components while passive components need to be replaced. The squib has a remaining useful life (RUL) of more than ten years with reliability over 99%.

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Reliability growth by failure mode removal

Cited by 17 publications

References 28 publications

Reliability analysis and prediction for time to failure distribution of an automobile crankshaft

Reliability analysis and prediction for time to failure distribution of an automobile crankshaft

Life prediction of heavy-load self-lubricating liners

Reliability and Remaining Life Assessment of an Electronic Fuze Using Accelerated Life Testing

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