Reliability Evaluation of Conventional and Interleaved DC–DC Boost Converters

Khosroshahi, Alireza E.; Abapour, Mehdi; Sabahi, Mehran

doi:10.1109/tpel.2014.2380829

Cited by 164 publications

(103 citation statements)

References 18 publications

(19 reference statements)

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“…9, and they can be fitted in terms of a Weibull distribution with a shape factor of 5.12 and scale factor of 6,804. It can be seen that the claimed lifetime of 5,000 hour in the datasheet means almost the B 20 lifetime. Moreover, the B X lifetime at any condition can be calculated based on this.…”

Section: A Weibull Lifetime Datamentioning

confidence: 95%

“…However, owing to the particular characteristics of the backup power application, this physics-of-failure based reliability evaluation cannot be performed with frequent switching between the standby mode and operation mode. Based on the component-level reliability metrics, the system-level reliability can instead be derived by using the Reliability Block Diagram (RBD), the Fault Tree Analysis (FTA), and the Markov Chain (MC) [20]- [27]. In [20]- [22], the reliability of an interleaved dc/dc boost converter, an induction motor drive, and a PEM fuel cell power plant are evaluated using the MC method.…”

Section: Introductionmentioning

confidence: 99%

“…Based on the component-level reliability metrics, the system-level reliability can instead be derived by using the Reliability Block Diagram (RBD), the Fault Tree Analysis (FTA), and the Markov Chain (MC) [20]- [27]. In [20]- [22], the reliability of an interleaved dc/dc boost converter, an induction motor drive, and a PEM fuel cell power plant are evaluated using the MC method. In addition, the RBD approach is used to analyze the reliability of a paralleled inverter system [23] and a multi-level converter [24].…”

Section: Introductionmentioning

confidence: 99%

See 2 more Smart Citations

Mission Profile Based System-Level Reliability Analysis of DC/DC Converters for a Backup Power Application

Zhou

Wang

Blaabjerg

2018

IEEE Trans. Power Electron.

147

126

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Abstract-Reliability analysis is an important tool for assisting the design phase of a power electronic converter to fulfill its life-cycle specifications. Existing converter-level reliability analysis methods have two major limitations: 1) based on constant failure rate models and 2) lack of considerations of long-term operation conditions (i.e., mission profile). Although various studies have been presented on power electronic component-level lifetime prediction based on wear-out failure mechanisms and mission profile, it is still a challenge to apply the same method to the reliability analysis of converters with multiple components. Component lifetime prediction based on associated models provides only a Bx lifetime information (i.e., the time when X% items fail), but the time-dependent reliability curve is still not available. In this paper, a converter-level reliability analysis approach is proposed based on time-dependent failure rate models and longterm mission profiles. Two different methods to obtain the component-level time-to-failure are illustrated by a case study of dc/dc converters for a 5 kW fuel cell based backup power system. The reliability analysis of the converters with and without redundancy is also performed to assist the decision making in the design phase of the fuel cell power conditioning stage.Index Terms-Fuel cell system, system-level reliability, Weibull distribution, power semiconductor, capacitor, reliability block diagram.

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Section: A Weibull Lifetime Datamentioning

confidence: 95%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

Mission Profile Based System-Level Reliability Analysis of DC/DC Converters for a Backup Power Application

Zhou

Wang

Blaabjerg

2018

IEEE Trans. Power Electron.

147

126

View full text Add to dashboard Cite

show abstract

“…In Reference [25], authors have used condition monitoring in order to estimate reliability. In Reference [26], the evaluation of reliability for a DC-DC Boost converter has been conducted with a reliability improvement approach. The reliability evaluation of modular multilevel converters (MMCs) as a very important topology must be noted.…”

Section: Human Reliabilitymentioning

confidence: 99%

A Comparative Reliability Study of Three Fundamental Multilevel Inverters Using Two Different Approaches

2016

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Abstract:The reliability of power electronic devices and components is very important to manufacturers. In recent years, many researchers have conducted reliability assessments of power electronic devices, yet the reliability of numerous circuits used widely has not been evaluated. This paper presents a comprehensive reliability evaluation of fundamental multilevel inverters. The reliability of the multilevel inverters is analyzed by calculating the mean time to failure for each component. The calculation was performed by two methods (approximate and exact) to achieve better comparisons. The approximate method is similar to the parts count method used in MIL-HDBK-217 reliability standard, and the exact method exhibits the parts stress method. In the exact method, due to the direct relationship between component failure and temperature, we used Matlab Simulink to determine power losses in diodes and switches taking into account the temperature factor. The results determined by the approximate method showed that the three-level cascade H-bridge was the most reliable of the inverters considered. Although the exact method validates those results, and shows that cascade H-bridge (CHB) had a longer lifespan, but the calculated values are different. Therefore, using different approaches for evaluating reliability results in different outcomes.

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“…In reference [22] an analysis of a high-power and high frequency voltage-fed inverter with a series resonant load circuit has been presented, and it is characterized by a full-bridge inverter composed of isolated-gate bipolar transistors. [23] calculates the reliability of an interleaved boost DC-DC converter, and presents a comparison between this and the reliability of the conventional boost converter.…”

Section: Introductionmentioning

confidence: 99%

The Effect of Series and Shunt Redundancy on Power Semiconductor Reliability

Nozadian¹,

Zarbil²,

Abapour³

2016

Journal of Power Electronics

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In different industrial and mission oriented applications, redundant or standby semiconductor systems can be implemented to improve the reliability of power electronics equipment. The proper structure for implementation can be one of the redundant or standby structures for series or parallel switches. This selection is determined according to the type and failure rate of the fault. In this paper, the reliability and the mean time to failure (MTTF) for each of the series and parallel configurations in two redundant and standby structures of semiconductor switches have been studied based on different failure rates. The Markov model is used for reliability and MTTF equation acquisitions. According to the different values for the reliability of the series and parallel structures during SC and OC faults, a comprehensive comparison between each of the series and parallel structures for different failure rates will be made. According to the type of fault and the structure of the switches, the reliability of the switches in the redundant structure is higher than that in the other structures. Furthermore, the performance of the proposed series and parallel structures of switches during SC and OC faults, results in an improvement in the reliability of the boost dc/dc converter. These studies aid in choosing a configuration to improve the reliability of power electronics equipment depending on the specifications of the implemented devices.

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Reliability Evaluation of Conventional and Interleaved DC–DC Boost Converters

Cited by 164 publications

References 18 publications

Mission Profile Based System-Level Reliability Analysis of DC/DC Converters for a Backup Power Application

Mission Profile Based System-Level Reliability Analysis of DC/DC Converters for a Backup Power Application

A Comparative Reliability Study of Three Fundamental Multilevel Inverters Using Two Different Approaches

The Effect of Series and Shunt Redundancy on Power Semiconductor Reliability

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