Abstract:In many different technological and industrial fields microelectronic device reliability is rising up as a fundamental aspect to consider during the design of diagnostic, optimization and control systems. Unexpected failures in diagnostic and control units could lead to a severe impact on the entire system/plant availability. Thus, reliability analysis must be carried out during the early phase of the design. MEMS (Micro-Electro-Mechanical Systems) based Inertial Measurement Units are widespread in diagnostic … Show more
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