Reliability Characterization of a Low-<i>k</i> Dielectric Using Magnetoresistance as a Diagnostic Tool

Williams, P. Andrew; Lloyd, J. R.

doi:10.1109/tdmr.2021.3104320

IEEE Trans. Device Mater. Relib.

2021

DOI: 10.1109/tdmr.2021.3104320

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Reliability Characterization of a Low-k Dielectric Using Magnetoresistance as a Diagnostic Tool

P. Andrew Williams

J. R. Lloyd

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Cited by 3 publications

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Engineering Science and Technology, an International Journal

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Reliability Characterization of a Low-k Dielectric Using Magnetoresistance as a Diagnostic Tool

Cited by 3 publications

References 18 publications

Highly sensitive miniaturized labyrinth shape circular split ring resonator (LC-SRR) based microwave sensor for low permittivity characterization applications

Highly sensitive miniaturized labyrinth shape circular split ring resonator (LC-SRR) based microwave sensor for low permittivity characterization applications

Erratum to “Reliability Characterization of a Low-k Dielectric Using Magnetoresistance as a Diagnostic Tool”

A Dual-Band Resonator Sensor for Low Permittivity Characterization

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