Reliability Challenges of Nanoscale Avalanche Photodiodes for High-Speed Fiber-Optic Communications

Huang, Jack Jia‐Sheng; Jan, Yu Heng; Chang, Hsiang-Szu; Ni, C. J.; Chou, Emin; Lee, S. K.; Chen, H. S.; Shi, Jin Wei

doi:10.1007/978-3-030-30113-2_7

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2021

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“…For both OLT and ONU, the transmitter and receiver are the main active components to send and receive the optical signals. For ONU, the light sources for transmitters are mainly based on 2.5G DFB and 10G DFB, and the detectors for receivers typically comprise 2.5G APD and 10G APD [8]. For OLT, 10G EML and 10G APD are commonly deployed in transmitters and receivers, respectively.…”

Section: Introductionmentioning

confidence: 99%

Novel failure mechanism of nanoscale mesa‐type avalanche photodiodes under harsh environmental stresses

Huang

Chang²,

Chou³

et al. 2021

IET Nanodielectrics

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Avalanche photodiode (APD) is an indispensable receiver component because of its high bandwidth and low noise performance. Recently, APD reliability, under harsh environmental stresses such as high heat and humidity, has drawn great interest in the applications of passive optical network, wireless, military, and free space optics. The authors study the APD degradation under the harsh environment of high humidity and high bias. The failure morphology through cross‐sectional scanning electron microscopy is shown, and a new moisture degradation model based on electrochemical oxidation to account for the failure mechanism is developed.

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Section: Introductionmentioning

confidence: 99%