2020
DOI: 10.1109/tpel.2019.2933063
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Reliability Assessment of Multistate Degraded Systems: An Application to Power Electronic Systems

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Cited by 19 publications
(20 citation statements)
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“…Failure modes, mechanisms and effects analysis (FMMEA) is employed to characterize the most critical failure mechanisms and components in the considered PECs based on the literature review and the field experiences. Regarding the automotive application, vibration loading and internal wear-out are found to be the most prevailing failure mechanisms in PECs [21,[37][38][39][40][41]. The analysis has also revealed that IGBT and power capacitors are the most critical components in PECs.…”
Section: A Methodology and Experimental Proceduresmentioning
confidence: 99%
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“…Failure modes, mechanisms and effects analysis (FMMEA) is employed to characterize the most critical failure mechanisms and components in the considered PECs based on the literature review and the field experiences. Regarding the automotive application, vibration loading and internal wear-out are found to be the most prevailing failure mechanisms in PECs [21,[37][38][39][40][41]. The analysis has also revealed that IGBT and power capacitors are the most critical components in PECs.…”
Section: A Methodology and Experimental Proceduresmentioning
confidence: 99%
“…2-The gradual degradation is a strictly non-decreasing function, ℛ(t)=ℛ(t;θ) where vector θ is a parameter reflecting the uncertainties. This function may be characterized through accelerated aging tests [21]. 3-Vibration random shocks are assumed to have an occurrence rate of λi(t)=(1+ξi)λ0(t) and λ0(t)=λ0+β ℛ(t;θ) [22], where λ0(t) and λi(t) are the initial and the i th occurrence rates of the vibration random shocks, respectively.…”
Section: B Model Assumptionsmentioning
confidence: 99%
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“…Demonstrate the technique to estimate residual lifetime as well as reuse the capability of used electronic components [81]. The power semiconductor and capacitor are explored using physics of failure, under ageing effect, and feasibility of the multistate degraded system is analyzed [82]. For NIMH battery cells, The methodology to analyze remaining useful life for reuse purposes, so that battery can be reused, in case they are disposed of before the end of their life [83].…”
Section: B Prognostics Of Electronic Componentsmentioning
confidence: 99%