Reliability assessment of 1.55-μm vertical cavity surface emitting lasers with tunnel junction using high-temperature aging tests

Long Wavelength VCSELs and VCSEL-Based Processing of Microwave Signals

“…Based on the statistical distributions of the totality of accelerated lifetime test (ALT) data, VCSEL aging parameters were calculated: activation energy value of E a =0.67 eV and current exponent factor N=3.93. The value of activation energy of 0.67 eV is close to 0.79 eVthe activation energy of 1550 nm VCSELs with active region in the same (InAlGaAs/InP) material system grown by MOVPE [24], even though devices with undercut apertures investigated in [24] do not exhibit gradual wear-out in time during ALT tests. Predicted operation lifetimes are calculated based on the accelerated life-time data and applying the acceleration factors and the pass-fail condition of 2-dB change.…”

Degradation mechanism of 1310nm vertical cavity surface emission laser

“…In 2003, the reliability of 1310 nm VCSELs with InGaAsN quantum well region was studied, and the median life at operating conditions was predicted [9] . In 2007, The activation energy of 0.79 eV and median lifetime of 2×10 7 hours for the 1550 nm VCSELs were extrapolated [10] . The 1310 nm long-wavelength VCSELs with InGaAsN quantum well were aged for 75 hours at 7.5mA and 150°C, and the dislocation arrays were observed by TEM.…”

VCSEL-based swept source for low-cost optical coherence tomography

“…According to the manufacturer's information, the basic device structure was the same as given in Fig. 1(a) [21]. In our experiment, the optical spectra of the VCSEL's output were measured with an optical spectrum analyzer (OSA) in DC and AC electric driving conditions.…”