2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) 2021
DOI: 10.1109/ipfa53173.2021.9617295
|View full text |Cite
|
Sign up to set email alerts
|

Reliability Analysis using Advanced Modeling Technique for MEMS Microphone

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2022
2022
2024
2024

Publication Types

Select...
2
1

Relationship

0
3

Authors

Journals

citations
Cited by 3 publications
(1 citation statement)
references
References 3 publications
0
1
0
Order By: Relevance
“…It also enables the simulation of microphone`s sensitivity, noise and THD at different bias voltages. The large signal non-linear model can also be utilized as a powerful tool to simulate the reliability performance of the MEMS devices which involves extremely high pressure events [24]. The described model capability will also be useful for accurately modeling dual backplate or sealed dual membrane MEMS microphone structures [25] - [26].…”
Section: Discussionmentioning
confidence: 99%
“…It also enables the simulation of microphone`s sensitivity, noise and THD at different bias voltages. The large signal non-linear model can also be utilized as a powerful tool to simulate the reliability performance of the MEMS devices which involves extremely high pressure events [24]. The described model capability will also be useful for accurately modeling dual backplate or sealed dual membrane MEMS microphone structures [25] - [26].…”
Section: Discussionmentioning
confidence: 99%