Reliability analysis incorporating exponentiated inverse Weibull distribution and inverse power law

Abstract

In reliability research, electronic devices are an important part of our lives and modelling their lives is the most difficult and fascinating area. To investigate the failure functioning of electronic equipments, reliability monitoring of systems is widely used. However, it is stated in the literature that one in five electronic system collapses are a consequence of degradation and saving energy and forecasting future losses, it is necessary to summarize the data through certain versatile models of probability . In current article, a model of reliability formed on inverse power law and generalized inverse Weibull model is suggested. This current distribution presents a clearer framework to modelling the efficiency and functionality lifespan of electronic equipments. In this article, an empirical analysis is discussed related to life cycle of a surface-mounted electrolytic capacitor (SMEC). In addition, it has noticed that evaluation of suggested distribution varies from classical model of inverse Weibull and that influences average time to failure (ATTF) of the studied capacitor. K E Y W O R D Selectronic devices, inverse power law, non-monotonic failure rate

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