New possibilities provided to recrystallization studies by X‐ray synchrotron radiation topography are tested and a preliminary investigation is presented. Reerystallization experiments are carried out in front of the X‐ray synchrotron beam and topographs are made to observe the grain growth process. Firstly, the potentialities of this new technique are discussed and compared to those of previous methods (electron microscopy, photoemission‐electron microscopy …︁) then it is shown what it allows to reach: 1) visibility of growth defect formation, 2) visibility of growth defect evolution, 3) catching a sight of nucleation‐growth transition, 4) perhaps distinguishing structure differences between moving and stationary grain boundaries.