1997
DOI: 10.1103/physrevb.56.6774
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Relativistic effects in electron-energy-loss-spectroscopy observations of theSi/SiO2interface plasmon peak

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Cited by 102 publications
(67 citation statements)
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“…Our computations on interface plasmons in semiconductors highlight a sensitivity to interface diffuseness which should be more easily detectable. Relativistic corrections, which we have ignored, are however more likely to be significant in this situation [17] than would be expected for bulk plasmon excitation in metals.…”
Section: Discussionmentioning
confidence: 97%
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“…Our computations on interface plasmons in semiconductors highlight a sensitivity to interface diffuseness which should be more easily detectable. Relativistic corrections, which we have ignored, are however more likely to be significant in this situation [17] than would be expected for bulk plasmon excitation in metals.…”
Section: Discussionmentioning
confidence: 97%
“…The usual circular objective aperture, imposing an axial cut-off q a , axially limits the Fourier range of loss probability as a function of x to values of q x < [q 1/2 . Within the restrictions of classical excitation theory, this effect can be modelled by a further Fourier transform of our data [17]. Another option, already explored as a route to higher spatial resolution in valence EELS [18], is to work with a spectrometer collection aperture displaced in the q y direction to select only high values of q with less need for non-local corrections but at the expense of reduced signal strength.…”
Section: Discussionmentioning
confidence: 99%
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“…We use the classical dielectric approach 10 to calculate the energy loss of the relativistic electron, as a function of its position across the well, for a sandwich interface. 11 Dielectric functions derived from the low energyloss spectra of the well and barrier test layers were input in a dedicated program. 12 Before comparing with the experimental results, the calculated positions of the plasmon energies across a well are convoluted with our estimated spatial resolution ͑ϳ0.7 nm͒.…”
mentioning
confidence: 99%
“…This means that the final result is not a superposition of the surface excitation to the bulk excitation but a replacement. We modelled the energy loss of the relativstic electron using the classical dielectric approach (Garcia-Molina 1985) for a sandwich interface (Turowski 1994, Moreau 1997, using dedicated software (Walsh 1992). This was done using the dielectric functions extracted from the energy loss spectra of barrier and well test layers grown under identical conditions as the superlattices.…”
Section: Spatial Resolutionmentioning
confidence: 99%