Relative Charge-Transfer Efficiencies ofP322and

Robert C. Amme

¹

,

Paul O. Haugsjaa

²

Abstract

We have shown that the concentration of Xe + 2 Pz/2 ions formed in an electron-impact ion source may be monitored by utilizing near-resonant charge transfer of Xe + beams with molecular oxygen. This measurement provides a means of assaying the fraction of excited ions in the Xe + beam and affords a technique for studying the effects of fine structure on the symmetric charge-transfer process: Xe^-fXe -» Xe+Xe + . With 25-eV electrons, we find that the Xe + beam is about 80% 2 P 3 /2 state, while the remaining 20% appears to be principally 2 Pi/2. The charge-transfer cross section for the excited component in xenon was found to be 1.0±0.15 relative to that of the 2 P%ii ion, over a large range of incident ion energy.

Ground experimental demonstration on remote sensing of neutral particles in the upper atmosphere using artificial ion beam

“…Next, the density of O 2 was evaluated from the experimental measurements. is derived from The measurements were assigned to to estimate the density of O 2 , The exact value on the CEX cross section between Xe + and O 2 was used the experimental data by Amme and Haugsjaa [1968]. L was taken as 0.4 m, which was the length of the CEX cell.…”