2006
DOI: 10.1088/0953-2048/19/4/014
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Relationship between architecture, filament breakage and critical current decay in Nb3Sn composite wires repeatedly in-plane bent at room temperature

Abstract: Six Nb 3 Sn composite wires with different architectures ('central and near-the-edge reinforcement') were repeatedly in-plane bent at room temperature (in-plane 'pre-bending'). Breakage behaviour was revealed from scanning electron microscopy observations by semi-quantitative analysis of the filament crack formation and evolution. Cracks are formed in the transversal and longitudinal directions. Transversal cracks show some tolerance to the applied bending strain due to the fact that filaments are composite ma… Show more

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Cited by 10 publications
(11 citation statements)
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References 22 publications
(29 reference statements)
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“…At present it is unclear how and if such variations are important for the residual strain and thus for critical superconducting characteristics of the as-reacted or pre-bent wires versus their architecture. Our experiments on crack formation, distribution and evolution with pre-bending strain ε pb have shown that the influence of the voids in this respect is relatively low, but it is noticeable for high ε pb 1.2% [6]. Other factors such as morphology of Nb in the CuNb micro-composite may influence mechanical (including residual strain) properties and behaviour of the wires during pre-bending.…”
Section: Critical Current Density J C and Normal State Resistance Rmentioning
confidence: 76%
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“…At present it is unclear how and if such variations are important for the residual strain and thus for critical superconducting characteristics of the as-reacted or pre-bent wires versus their architecture. Our experiments on crack formation, distribution and evolution with pre-bending strain ε pb have shown that the influence of the voids in this respect is relatively low, but it is noticeable for high ε pb 1.2% [6]. Other factors such as morphology of Nb in the CuNb micro-composite may influence mechanical (including residual strain) properties and behaviour of the wires during pre-bending.…”
Section: Critical Current Density J C and Normal State Resistance Rmentioning
confidence: 76%
“…15 and 19 T, respectively). Lower ε pb,max (J c ) than ε pb,max (B c2 ) for some wires is due to irreversible crack formation [6] and their fast development at ε pb 0.8%, leading to an earlier and stronger decay of J c than of B c2 (compare figures 6 and 7(a) and (b)). In other words, J c is strongly dependent on crack occurrence and evolution, while B c2 is weakly dependent.…”
Section: Pre-bent Wiresmentioning
confidence: 94%
“…Final polishing is conducted with a 0.05 μm silica suspension to permit high-resolution imaging in the SEM. Finally, the sample surface is lightly dip-etched in an HF-HNO 3 solution to remove the polishing deposit and to enhance the contrast around the micro-cracks without enlarging their size [95], [170]. The SEM images allow identifying the locations of the cracks, voids and filaments across the entire width of the filamentary region and along a length of 8 to 9 mm, which corresponds to slightly over two periodic bending wavelengths.…”
Section: Influence Of Crack Distribution On Ac Lossmentioning
confidence: 99%
“…Several authors have addressed crack dynamics in various types of Nb 3 Sn wires, either mono-or multi-filamentary [168], [169]; ITER-type [93]; or specially reinforced [170]. The crack pattern in isolated filaments induced in TARSIS periodic bending tests at the University of Twente [119] were investigated with a ''postmortem'' microscopic analysis at Florida State University (FSU).…”
Section: Introductionmentioning
confidence: 99%
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