2003
DOI: 10.1557/mrs2003.39
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Relations Between Basic Nuclear Data and Single-Event Upsets Phenomena

Abstract: This article approaches single-event upset (SEU) problems from the standpoint of experimental nuclear physics, with a focus on certain neutron experiments and neutron data essential for SEU studies. A review is given of some research programs, both basic and applied, that are strongly motivated by SEU applications. Some specific examples are presented from the The (short for Theodor) Svedberg Laboratory (TSL) in Uppsala, Sweden: First, using the quasi-monoenergetic neutron beam, SEU cross sections (of chips) a… Show more

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Cited by 9 publications
(6 citation statements)
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“…Thus, similar to the case of medical applications, detailed knowledge of the nuclear interaction of neutrons with silicon, and even oxygen, are needed. These, together with an adequate description of the electrical and geometrical properties of the decives might lead to a full understanding of the SEU problem [16].…”
Section: Neutron-induced Electronic Failuresmentioning
confidence: 99%
“…Thus, similar to the case of medical applications, detailed knowledge of the nuclear interaction of neutrons with silicon, and even oxygen, are needed. These, together with an adequate description of the electrical and geometrical properties of the decives might lead to a full understanding of the SEU problem [16].…”
Section: Neutron-induced Electronic Failuresmentioning
confidence: 99%
“…This has motivated nuclear data research for transmutation of spent nuclear fuel [1,2,3], neutron therapy of cancer tumours [4] and upsets in electronics [5,6]. In the present paper, present and future facilities for nuclear data production for these applications are discussed.…”
Section: Introductionmentioning
confidence: 98%
“…[4], and upsets in electronics are discussed in ref. [5,6]. In the present work, a programme on elastic neutron scattering at 96 MeV is presented, which deals with all these applications.…”
Section: Introductionmentioning
confidence: 99%