The local critical current along a sample length is different from position to position in a long sample, especially when the sample is damaged by externally applied strain. In the present work, we attempted to reveal the relation of the distribution of the local critical current to overall critical current and the sample-length dependence of critical current for slightly and significantly damaged Bi2223 composite tape samples. In the experiment, 48 cm long Bi2223 composite tape samples, composed of 48 local elements with a length of 1 cm and 8 parts with a length 6 cm, were bent by 0.37 and 1.0% to cause slight and significant damage, respectively. The V-I curve, critical current (1 μV cm −1 criterion) and n value were measured for the overall sample as well as for the local elements and parts. It was found that the critical current distributions of the 1 cm elements at 0.37 and 1.0% bending strains are described by the three-parameter-and bimodal Weibull distribution functions, respectively. The critical current of a long sample at both bending strains could be described well by substituting the distributed critical current and n value of the short elements into the series circuit model for voltage generation. Also the measured relation of average critical current to sample length could be reproduced well in the computer by a Monte Carlo simulation method. It was shown that the critical current and n value decrease with increasing sample length at both bending strains. The extent of the decrease in critical current with sample length is dependent on the criterion of the critical current; the critical current decreases only slightly under the 1 μV cm −1 criterion which is not damage-sensitive, while it decreases greatly with increasing sample length under damage-sensitive criteria such as the 1 μV one.