The electrical characteristics and interfacial trap levels at grain boundaries of SrCoO 3 (SCO, 0.253.0 mol %)-added ZnO varistors were investigated. A marked nonlinearity was observed in the VJ characteristics. The resistance to electrical degradation correlated with the orientation of the (100) plane of ZnO grains: the resistance was large when the (100) plane was parallel to the electrode. Isothermal capacitance transient spectroscopy revealed two kinds of interfacial trap levels. The deeper level was observed in all samples. The shallower level was observed only in samples with 2.5 mol % or more added SCO. Each trap level had a concentration that increased in proportion to the temperature. At room temperature, the concentrations of all trap levels in samples with 2.0 mol % or less SCO were much lower. As a result, no transient capacitance was observed under an applied bias voltage. This suggests that the main cause of the nonlinearity observed in VJ characteristics of samples with 2.0 mol % or less SCO was not the presence of interfacial trap levels, but rather the Co and/or ZnSrO 2 in the ZnO grains.