1999
DOI: 10.1109/23.747765
|View full text |Cite
|
Sign up to set email alerts
|

Region-of-interest microtomography for component inspection

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1

Citation Types

0
3
0

Year Published

2007
2007
2016
2016

Publication Types

Select...
6

Relationship

0
6

Authors

Journals

citations
Cited by 7 publications
(3 citation statements)
references
References 42 publications
0
3
0
Order By: Relevance
“…In zoom‐in tomography, low‐resolution data about the information outside the RoI is combined with the high‐resolution data within the RoI to produce a best estimate reconstruction (Nalcioglu et al , 1979; Ohyama et al , 1984; Gentle & Spyrou, 1990; Kalukin et al , 1999; Chun et al , 2004; Tisson et al , 2004; Xiao et al , 2007). These methods can be rather difficult to undertake experimentally and require very accurate registration of the low‐ and high‐resolution projections.…”
Section: Introductionmentioning
confidence: 99%
“…In zoom‐in tomography, low‐resolution data about the information outside the RoI is combined with the high‐resolution data within the RoI to produce a best estimate reconstruction (Nalcioglu et al , 1979; Ohyama et al , 1984; Gentle & Spyrou, 1990; Kalukin et al , 1999; Chun et al , 2004; Tisson et al , 2004; Xiao et al , 2007). These methods can be rather difficult to undertake experimentally and require very accurate registration of the low‐ and high‐resolution projections.…”
Section: Introductionmentioning
confidence: 99%
“…For specimens with complex, highly anisotropic cross-sections or with high frequency, anisotropic internal structure, it is essential to ascertain the extent of artefacts. 171 A number of groups/facilities routinely use local tomography. In a custom built lab microCT system, local tomographic reconstruction compared well with reconstruction with the complete FOV.…”
Section: X-ray Microct Using Signals Other Than Absorption or Phasementioning
confidence: 99%
“…In spite of remarkable results obtained both with laboratory and synchrotron set-ups [1]- [3], inspection of laterally extended objects (e.g. circuit boards) with CT remains a problematic task in various industrial and scientific applications [4]. Even with monochromatic synchrotron radiation, the reconstructed images suffer from imaging artefacts [5] resulting from the nonuniform transmission due to a strongly varying object thickness (and thus beam intensity attenuation) for the different projection directions.…”
Section: Introductionmentioning
confidence: 99%