2013
DOI: 10.2528/pierb12102605
|View full text |Cite
|
Sign up to set email alerts
|

Refractive Index and Thickness Evaluation of Monomode and Multimode Step-Index Planar Optical Waveguides Using Longitudinal Section Magnetic (Lsm) and Longitudinal Section Electric (Lse) Formulation

Abstract: Abstract-In this work, we demonstrate that the LSM and LSE modes formulation is an excellent theoretical tool for determining the refractive index and thickness of the guiding layer in planar optical waveguides with step refractive index profile. Refractive index of transparent materials capable of being deposited as a solid thin layer on a substrate for confining light can be evaluated very accurately. The method can be applied to analyze and design monomode and multimode optical waveguides, unlike the method… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2015
2015
2015
2015

Publication Types

Select...
1

Relationship

0
1

Authors

Journals

citations
Cited by 1 publication
(1 citation statement)
references
References 13 publications
0
1
0
Order By: Relevance
“…For that purpose, refractometry techniques were employed to measure n s , while the evaluation of n f was carried out by means the Longitudinal Section Electric (LSE) (E x pq and quasi-TE) and Longitudinal Section Magnetic (LSM) (E y pq and quasi-TM) guided modes formulation, which was specifically developed by the authors in order to calculate refraction index and thickness of polymeric microlayers [11]. E x pq (quasi-TE) and E y pq (quasi-TM) guided modes in CPOWEG were simulated.…”
Section: Contents Lists Available At Sciencedirectmentioning
confidence: 99%
“…For that purpose, refractometry techniques were employed to measure n s , while the evaluation of n f was carried out by means the Longitudinal Section Electric (LSE) (E x pq and quasi-TE) and Longitudinal Section Magnetic (LSM) (E y pq and quasi-TM) guided modes formulation, which was specifically developed by the authors in order to calculate refraction index and thickness of polymeric microlayers [11]. E x pq (quasi-TE) and E y pq (quasi-TM) guided modes in CPOWEG were simulated.…”
Section: Contents Lists Available At Sciencedirectmentioning
confidence: 99%