2004
DOI: 10.1051/jp4:2004118018
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Réflexion et fluorescence X : une complémentarité au profit de la caractérisation des surfaces

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Cited by 5 publications
(8 citation statements)
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“…X-ray diffraction (XRD) measurements were performed using a homemade goniometer (Zerrouki et al 2004;Medhioub et al 2007). The X-ray pattern was obtained with Kα2-filtered Cu Kα1 radiation (Si 111 crystal monochromator) using a Seifert X-ray generator operating at 35 kV and 35 mA.…”
Section: X-ray Diffraction (Xrd) Measurementsmentioning
confidence: 99%
“…X-ray diffraction (XRD) measurements were performed using a homemade goniometer (Zerrouki et al 2004;Medhioub et al 2007). The X-ray pattern was obtained with Kα2-filtered Cu Kα1 radiation (Si 111 crystal monochromator) using a Seifert X-ray generator operating at 35 kV and 35 mA.…”
Section: X-ray Diffraction (Xrd) Measurementsmentioning
confidence: 99%
“…However, the particular shape associated with this measurement mode can be useful. 19,21 The first measurements corresponding to RC-0.7°are presented in Fig. 8.…”
Section: Rocking Curve Modesmentioning
confidence: 99%
“…The X-ray reflectometer used in this study has been designed and constructed at the "Laboratoire de Physique du Cnam" [16,17]. The Fluorescence X detector is a KETEK AXAS-SDD (Silicon Drift Detector).…”
Section: Physico-chemical Characterizationmentioning
confidence: 99%